2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo) 2017
DOI: 10.1109/emccompo.2017.7998086
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Study of the thermal aging effect on the conducted emission of a synchronous buck converter

Abstract: This paper studies the impact of the accelerated thermal aging on the conducted emission produced by a synchronous buck converter. The most degraded devices mounted on the DC-DC converter are identified and modeled in order to simulate the evolution of conducted emission and anticipate risks of non-compliance to emission requirements.

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