Study of the structural and magnetic characteristics of epitaxial Fe3Si/Si(111) films

Yakovlev, I. A.; Варнаков, С. Н.; Belyaev, B. A.; Жарков, С. М.; Мolokeev, Maxim S.; Тарасов, И. А.; Овчинников, С. Г.

doi:10.1134/s0021364014090124

Cited by 28 publications

(18 citation statements)

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“…The coercive force measured for Fe 3 Si slightly exceeds the values obtained by other authors [7,28], including those for films on GaAs(001) and Ge(111) substrates [29,30]. The coercive force for the Fe 5 Si 3 film is close to values measured for Fe 3 Si, but it is half as large as the value obtained for the polycrystalline Fe 5 Si 3 film with a thickness 65 nm from [10] and slightly exceeds the value of H c for a Fe 5 Si 3 nanofila ment at room temperature [31].…”

Section: Resultscontrasting

confidence: 68%

“…The SiO 2 layer with a thickness of about 13.6 nm was formed by thermal oxidation of the Si(100) substrate in an O 2 + HCl medium at a temperature of 1000°C. After oxida tion, the substrate was degreased according to the method proposed in [7], placed in an ultrahigh vac uum, and then annealed at 250°C.…”

Section: Analysis Of Optical and Magnetooptical Spectra Of Fe 5 Si 3 mentioning

confidence: 99%

“…Silicide Fe 3 Si is characterized by a large electron spin polarization factor [4,5] and can be grown epi taxially on a Si(111) single crystal [6,7]. In turn, the Fe 5 Si 3 silicide implanted in silicon demonstrates the giant magnetoresistance effect (2400%) [1], but is thermodynamically unstable in the bulk state at room temperature [8].…”

Section: Introductionmentioning

confidence: 99%

“…A. Kuzubov b,c , S. G. Ovchinnikov a,b, [11]. The method for pre paring the substrate and obtaining the given struc ture is described in detail in [7]. According to the spectral ellipsometry data, the total thickness of the Fe 3 Si layer was 27 nm.…”

Section: Introductionmentioning

confidence: 99%

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Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Lyashchenko

Попов

Варнаков

et al. 2015

J. Exp. Theor. Phys.

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The optical, magnetooptical, and magnetic properties of polycrystalline (Fe 5 Si 3 /SiO 2 /Si(100)) and epitaxial Fe 3 Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe 5 Si 3 is measured using multiangle spectral ellipsometry in the range of 250-1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe 5 Si 3 and Fe 3 Si in the range of 1.6-4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin polarized densities of electron states (DOS) calculated from first principles for bulk Fe 5 Si 3 and Fe 3 Si crystals.

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Section: Resultscontrasting

confidence: 68%

Section: Analysis Of Optical and Magnetooptical Spectra Of Fe 5 Si 3 mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Lyashchenko

Попов

Варнаков

et al. 2015

J. Exp. Theor. Phys.

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“…The formation of the film structure was controlled by an LEF 751M high speed laser ellipsometer [10]. The technique used for the preparation of the atomically clean Si(111)7 × 7 surface, the process of growth of Fe 3 Si/Si(111)7 × 7 film, and the data on the structure of this film and its magnetic properties were described in [11].…”

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Optical characteristics of an epitaxial Fe3Si/Si(111) iron silicide film

et al. 2014

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1.Currently, ferromagnetic iron silicide Fe 3 Si turns out to be a promising material for such applications as spin transistors, magnetoresistive memory, and mag neto optical devices [1][2][3][4] owing to its high Curie temperature (about 840 K), relatively high magnetic permeability, low magnetic and crystallographic anisotropy, high electrical resistivity, and high spin polarization (as high as 43%). During the last decade, thin films of this material have been widely studied. A lot of papers deal with the interplay of their structural and magnetic characteristics [5,6], as well as with the transport properties and developments of prototypes of spintronic devices [7,8]. However, the electronic structure and optical properties of Fe 3 Si are still rather poorly studied. In particular, the energy dependence of its relative permittivity is treated only in one theo retical paper [9], the results of which have not been verified by experiment. The main aims of our work are to study the optical characteristics of an epitaxial Fe 3 Si/Si(111) iron silicide film and to determine the dispersion of the relative permittivity ε using the spec troscopic ellipsometry technique. 2.The Fe 3 Si film was obtained by the thermal evap oration technique in ultrahigh vacuum at the recon structed Si(111)7 × 7 surface. The formation of the film structure was controlled by an LEF 751M high speed laser ellipsometer [10]. The technique used for the preparation of the atomically clean Si(111)7 × 7 surface, the process of growth of Fe 3 Si/Si(111)7 × 7 film, and the data on the structure of this film and its magnetic properties were described in [11].The data obtained by single wavelength ellipsome try for the synthesized Fe 3 Si/Si(111) film (Fig. 1) were analyzed by the method described in [12]. This analy sis was based on the optical model involving a homo geneous isotropic film at a semi infinite isotropic sub strate. The value obtained for the thickness of the formed film agrees well with the data provided by transmission electron microscopy. It equals 27 nm.In Fig. 1, we can see that the behavior of the thick ness at the initial stages of the film growth is not phys ical. The calculated refractive index n and the coeffi cient of absorption k vary drastically beginning from values close to the optical parameters of silicon (n = 3.93 and k = 0.54) to those characteristic of conduct ing materials (n = 3.43 and k = 3.54). We attribute such behavior at the initial stage of the film formation to the epitaxial island growth mechanism, rather than to layer by layer growth. After 45 min of film growth, the thickness begins growing monotonically and n and k achieve values remaining unchanged in the course of further growth. Thus, when the effective thickness achieves 5 nm, the Fe 3 Si film forms as a continuous layer. The values of the real and imaginary parts of the relative permittivity determined by the laser ellipsom etry (λ = 632.8 nm) at a temperature of 150° are ε' = -0.97 and ε'' = 24.07, respectively.3. In the present work, the energy ...

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Effect of local environment on moment formation in iron silicides

Zamkova

Zhandun

Овчинников

et al. 2017

Journal of Alloys and Compounds

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The effect of local environment on the formation of magnetic moments on Fe atoms in iron silicides are studied by combination of ab initio and model calculations. The suggested model includes all Fe dand Si p-orbitals, intra-atomic Coulomb interactions, inter-atomic Fe-Fe exchange and hopping of electrons to nearest and next nearest neighboring atoms and takes into account all symmetries within the Slater-Koster scheme. The parameters of the model are found from the requirement that self-consistent moments on atoms and density of states found from ab initio and model calculations within the Hartree-Fock approximation are close to each other as much as possible. Contrary to the commonly accepted statement that an increase of the Si concentration within nearest environment of Fe atoms in the ordered Fe 3 Si and Fe x Si 1-x alloys leads to a decrease of Fe magnetic moment we find that a crucial role in the formation of magnetic moments is played by second coordination sphere of Fe atoms. Particularly, the Fe atoms have higher magnetic moments in amorphous films compared to the epitaxial ones due to decrease in the number of iron-atoms' in the next nearest environment. Both our model and ab initio calculations confirm existence of known spin crossover with pressure and predict second crossover at higher pressure.

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Study of the structural and magnetic characteristics of epitaxial Fe3Si/Si(111) films

Cited by 28 publications

References 18 publications

Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry

Optical characteristics of an epitaxial Fe3Si/Si(111) iron silicide film

Effect of local environment on moment formation in iron silicides

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