Study of the piezoelectric properties of rubidium acid phthalate crystals by time-resolved three-crystal X--ray diffractometry

Abstract

Using the method of time-resolved X-ray diffractometry in a three-crystal scheme, the lattice deformation of a rubidium biphthalate (C8H5RbO4) crystal was measured in an external electric field. Under the action of an external pulsed electric field along the [001] polar direction, the piezoelectric moduli d31,d32, and d33 were determined independently using three reflections 400, 070, and 004; the obtaind values are -32.8±0.6, 12.8±0.3, and 21.8±1.2 pC/N, respectively. A good agreement was found between the values of the piezoelectric moduli obtained in this work and the values obtained earlier by the quasi-static method. Keywords: piezoelectric effect, time-resolved X-ray diffractometry, three-crystal diffraction scheme, acid phthalate crystals, external electric field.

Local variations of the piezoelectric properties of an LiNb(1−x)Ta x O3 crystal

“…In the majority of cases, measurements by common techniques provide accuracy of about 10%, which is considered satisfactory (Blagov et al, 2013;Marchenkov et al, 2018;Palatnikov et al, 2020). Among a variety of methods for studying piezoelectric properties, X-ray diffraction (XRD) occupies a special place, and allows highly spatially localized and accurate measurements (Blagov et al, 2013;Irzhak & Roshchupkin, 2013;Ibragimov et al, 2022), especially when using sources of synchrotron radiation (SR) (Palatnikov et al, 2020;Gorfman et al, 2007).…”