Non empirical methods for obtaining information from EPR, ENDOR and optical data on the true impurity-ligand distance, R, as weU as on the true va¡ AR, induced by chemical and hydrostatic pressures, phase transiUons in the host material and temperature changes are discussed through this work. Special attention is addressed to spectroscopic parameters of d-impurities whose dependence on R can reasonably be calculated theoretically for the superhyperfine (shf) tensor or the lowest optical transitions but not for fine structure temas. In the case of Ÿ with unpalred o-electrons it is shown that the isotropic shf constant, A~, is specially sensitive to R changes.The microscopic origJn of this fact is discussed in detail. Determination of true R values from experimental A s has been carried out for impurities like Mn 2+ or Ni + with encouraging results. In the case of Mn 2+ in fluorides, results obtained by this method coincide with those reached through EXAFS and the analysis of the experimental 10 Dq. FinaUy, for some selected complexes, a view is offered on the dependence of several EPR and optical parameters upon metal-ligand distances. The ma_in conclusion is that AR values of the order of 0.1 pro can be detected using EPR and optical parameters thus irnproving by an order of magnitude the sensitivity reached through EXAFS. In particular the use of ENDOR allows one to measure AR values close to 0.01 pm.