STUDY OF THE DIELECTRIC AND MICROSTRUCTURE PROPERTIES OF (1-x) CaCu₃TI₄O₁₂ – (x) PbZr_0.65Ti_0.35O₃ COMPOSITE

Abstract

synthesized by sol-gel route. X-ray diffraction (XRD), scanning electron micrograph (SEM), FT-IR spectrum (IR) was used to reach the structural properties of the studied compounds. The XRD and IR studies confirm the formation of pure phase for x = 0.00 and 1.00 concentrations i.e cubic and tetragonal, respectively. The SEM show change in the grain distribution, size and shape at addition of PbZr 0.65 Ti 0.35 O 3 . Dielectric measurements were made by using an impedance analyzer, the results show that the dielectric constant of the CCTO/PZT composite is greater than that of pure CCTO and than that of pure PZT. The temperature dependence of the ac conductivity indicated that the conduction process is due to singly and doubly ionized, and frequency dependence of the ac conductivity of composites follows Jonscher's power law.