2016
DOI: 10.1134/s1063782616050031
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Study of the correlation properties of the surface structure of nc-Si/a-Si:H films with different fractions of the crystalline phase

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Cited by 7 publications
(1 citation statement)
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“…The method of average mutual information [6,17] estimates ordering and information capacity of a structure. The method of two-dimensional detrended fluctuation analysis (2D DFA) and its application are described in [17,18]. Input information for 2D DFA method is three-dimensional data on a relief of a surface.…”
Section: Methods For Investigating Structural Features In Solid-state...mentioning
confidence: 99%
“…The method of average mutual information [6,17] estimates ordering and information capacity of a structure. The method of two-dimensional detrended fluctuation analysis (2D DFA) and its application are described in [17,18]. Input information for 2D DFA method is three-dimensional data on a relief of a surface.…”
Section: Methods For Investigating Structural Features In Solid-state...mentioning
confidence: 99%