2004 Help me understand this report
Study of the breakdown voltage in lateral polysilicon N+P junctions
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2013
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“…This is the mostly noticed path. Previous studies [12,13] found the same behavior of the crack with respect of the stem position.…”
Section: Sif>0supporting
confidence: 68%
“…This is the mostly noticed path. Previous studies [12,13] found the same behavior of the crack with respect of the stem position.…”
Section: Sif>0supporting
confidence: 68%
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