Study of the aberration induced by an array of microlenses

Roblin, G.; Horville, D.

doi:10.1088/0150-536x/24/2/005

Cited by 7 publications

(2 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…If some theoretical works, where analytical formulas are used, account for this term, 49 it is often forgotten. 50 We cross-checked the numerical formula for the complex transmittance and the analytical solution in a simulation, as shown in Appendix A.3. ¶ For numerical simulations, in terms of angular position (x, y) = f (αx, αy), this can also be interpreted as a tilt introduced in the wavefront, deflecting the light in the direction of the wave vector (η /f, ξ /f ) = (αx , αy ).…”

Section: A1 Complex Transmittance Of a Sh-wfs Pupilmentioning

confidence: 99%

Inverse problem approach in Extreme Adaptive Optics: analytical model of the fitting error and lowering of the aliasing

Berdeu,

Tallon,

Thiébaut

et al. 2023

Preprint

View full text Add to dashboard Cite

We present the results obtained with an end-to-end simulator of an Extreme Adaptive Optics (XAO) system control loop. It is used to predict its on-sky performances and to optimise the AO loop algorithms. It was first used to validate a novel analytical model of the fitting error, a limit due to the Deformable Mirror (DM) shape. Standard analytical models assume a sharp correction under the DM cutoff frequency, disregarding the transition between the AO corrected and turbulence dominated domains. Our model account for the influence function shape in this smooth transition. Then, it is well-known that Shack-Hartmann wavefront sensors (SH-WFS) have a limited spatial bandwidth, the high frequencies of the wavefront being seen as low frequencies. We show that this aliasing error can be partially compensated (both in terms of Strehl ratio and contrast) by adding priors on the turbulence statistics in the framework of an inverse problem approach. This represents an alternative to the standard additional optical filter used in XAO systems. In parallel to this numerical work, a bench was aligned to experimentally test the AO system and these new algorithms comprising a DM192 ALPAO deformable mirror and a 15×15 SH-WFS. We present the predicted performances of the AO loop based on end-to-end simulations.

show abstract

Section: A1 Complex Transmittance Of a Sh-wfs Pupilmentioning

confidence: 99%

Inverse problem approach in Extreme Adaptive Optics: analytical model of the fitting error and lowering of the aliasing

Berdeu,

Tallon,

Thiébaut

et al. 2023

Preprint

View full text Add to dashboard Cite

show abstract

“…Photoresist microlenses are commonly transferred by etching into different substrates in order to improve their optical and mechnical characteristics [lo, 111. The usual parameters for microlens characterization include the shape and radius of curvature of the microlens refracting surface, the shape of the exiting wave front, the point spread function (PSF) and the modulation transfer function (MTF) [12- information can be used in order to check the consistency of the results obtained. Coherent effects between the refracted wave fronts produced at neighbouring microlenses have to be taken into account when characterizing the performance of closely spaced microlens arrays [17].…”

Section: Introductionmentioning

confidence: 99%

Interferometric monitoring of surface shaping processes in microlenses produced by melting photoresist

Mancebo

Bará

1998

Journal of Modern Optics

View full text Add to dashboard Cite

The gradual deformation of a melted photoresist pre-form as it changes to the final microlens surface shape is monitored by an adapted MachZehnder interferometer. This set-up makes it possible to record a continuous set of interferograms from which the microlens surface evolution can be determined. The loss of volume produced in the first steps of melting as well as the progressive changes in curvature and spherical aberration of the refracted wave front are evaluated.

show abstract

Interferometrical method of testing the microlens arrays

Roblin

1995

J. Opt.

View full text Add to dashboard Cite

Study of the aberration induced by an array of microlenses

Cited by 7 publications

References 13 publications

Inverse problem approach in Extreme Adaptive Optics: analytical model of the fitting error and lowering of the aliasing

Inverse problem approach in Extreme Adaptive Optics: analytical model of the fitting error and lowering of the aliasing

Interferometric monitoring of surface shaping processes in microlenses produced by melting photoresist

Interferometrical method of testing the microlens arrays

Contact Info

Product

Resources

About