Study of surface recombination on cleaved and passivated edges of Si detectors

Gaubas, E.; Čeponis, T.; Fadeyev, V.; Ely, S.; Galloway, Z.; Sadrozinski, H. F-W.; Christophersen, M.; Phlips, Bernard F.; Gorelov, I.; Hoeferkamp, M. R.; Metcalfe, J.; Seidel, S. C.

doi:10.1088/0268-1242/31/3/035003

Cited by 1 publication

(1 citation statement)

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“…Note that the actual surface recombination velocity at the oxide-silicon interface is highly process dependent [10,11]. In practice, the sensor process requirements and limits on x-ray blocking insulator thickness may constrain process options.…”

Section: Tcad Simulationsmentioning

confidence: 99%

Thin-Entrance Window Process for Soft X-Ray Sensors

Segal

Kenney

Kowalski³

et al. 2021

Front. Phys.

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New free electron lasers, such as SLAC’s LCLS-II, will provide unique scientific imaging opportunities. In order to fully utilize these facilities, we need to develop detectors with shallow entrance windows that will enable detection of soft x-rays from 250 eV to 1.5 KeV. Achieving adequately shallow entrance windows is challenging because the high temperature anneal needed to activate the dopant also drives the dopant profile deeper, growing the region that is insensitive to soft x-rays. A new microwave annealing technology provides an efficient way to achieve shallow entrance windows in fully depleted high-resistivity silicon sensors. The microwave anneal technique can activate dopants at low substrate temperature, with minimal dopant diffusion, and can be used to fabricate both n-type and p-type entrance windows. SRP and SIMS measurements were used to verify dopant activation with negligible dopant diffusion. We then applied the microwave anneal process to a planar sensor wafer, using the new process to create the backside diode contact. Electrical test of the resulting sensors shows good reverse bias characteristics. The sensors have been bump-bonded to a read-out ASIC and used successfully to measure an Fe-55 x-ray spectrum. Process and device simulations were performed to characterize the quantum efficiency of the entrance window for soft x-rays. This technique is useful for other sensor applications requiring a shallow entrance window, including detectors for UV photons, low energy ions and low energy electrons.

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Section: Tcad Simulationsmentioning

confidence: 99%