Study of Structural, Morphological and Compositional Characteristics of Vacuum Deposited Zn0.75cd0.25se Thin Films

Abstract

In this study, Zn 0.75 Cd 0.25 Se ternary semiconductor thin films of thickness 1000 A 0 and 2500 A 0 belong to II-VI group were deposited onto glass substrates by the vacuum deposition method under the pressure of 10 -5 mbar. The effect of Zinc content on different physics and chemical properties in Zn 0.75 Cd 0.25 Se thin films has been investigated. Systematic characterizations of structural, morphological and compositional, properties have been carried out by XRD, SEM and EDAX.