We demonstrate photovoltaic and photoconductive responses
to near-infrared light in devices formed by depositing a film of gel
permeation chromatography purified PbS quantum dots (QDs) on top of
n-SiC epitaxial layers with natively grown, low-leakage 10–15
monolayer thick epitaxial graphene (EG) Schottky contacts. The QD
film layer was removable by selective chemical etching, resetting
the EG/SiC Schottky diode: the sub-bandgap response could be restored
in subsequent PbS-QD depositions. The EG in these devices simultaneously
forms Schottky contacts to SiC and ohmic contacts to PbS-QD, enabling
electrical screening and isolation of these interfaces from each other.
After PbS-QD deposition, the diodes exhibit photovoltaic and photoconductive
responses at photon energies far below the SiC bandgap, extending
to the NIR gap of the QD film. Scanning photocurrent microscopy illustrates
that this is due to charge transfer from the QD film to the n-type
4H-SiC through a trap-limited, rectifying PbS-QD/SiC heterojunction
with ideality n = 2 in parallel with the EG/SiC Schottky
diode. The photoconductive gain at this QD/SiC interface could be
useful for IR detection in wide-bandgap platforms. Response times
as fast as 40 ms are suitable for imaging applications, although careful
contact design is required to optimize work-function matching and
spreading resistance.