Microbeam and Nanobeam Analysis 1996
DOI: 10.1007/978-3-7091-6555-3_37
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Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis

Abstract: Abstract. Submicron colloidal Ag particles and nano-sized filaments forming a statistical percolation network during "in situ" development of double structure tabular microcrystals of AgBr(I) emulsions have been studied by electron energy-loss spectroscopy and zero-loss electron spectroscopic imaging (EELS/ ZLESI). Image analysis has shown that random quasi-fractal clusters were formed in the colloid. ZLESI has been applied to characterise the morphology and defect structure of aggregated particles and filamen… Show more

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“…There are still questions and uncertainties associated with the technique that remain to be quantified, such as the effects of bonding and structure type on the plasmon peak energies, but the examples on the g and u ' precipitates analyzed illustrate the potential of the technique to better understand structure-property relationships in materials. A: Ahn and Krivanek, 1983;AJ: Ashby and Jones, 1986;C: Callister, 2000;E: Egerton, 1996;HL: Hirth and Lothe, 1982;KM: Krenn et al, 1998;P: Puls, 1984;PF: Pfluger et al, 1984; PW: present work; O: Oleshko et al, 1996;R: Reimer et al, 1992;Ra: Raether, 1980;S: Srivastava, 1982;SB: Stephens and Brown, 1980;SE: Senkov et al, 1996; SH: Smithells, 1991; T: Thomas, 1981; WC: Woo and Carpenter, 1986; Z: Zaluzec et al, 1981.…”
Section: Discussionmentioning
confidence: 89%
“…There are still questions and uncertainties associated with the technique that remain to be quantified, such as the effects of bonding and structure type on the plasmon peak energies, but the examples on the g and u ' precipitates analyzed illustrate the potential of the technique to better understand structure-property relationships in materials. A: Ahn and Krivanek, 1983;AJ: Ashby and Jones, 1986;C: Callister, 2000;E: Egerton, 1996;HL: Hirth and Lothe, 1982;KM: Krenn et al, 1998;P: Puls, 1984;PF: Pfluger et al, 1984; PW: present work; O: Oleshko et al, 1996;R: Reimer et al, 1992;Ra: Raether, 1980;S: Srivastava, 1982;SB: Stephens and Brown, 1980;SE: Senkov et al, 1996; SH: Smithells, 1991; T: Thomas, 1981; WC: Woo and Carpenter, 1986; Z: Zaluzec et al, 1981.…”
Section: Discussionmentioning
confidence: 89%