2021
DOI: 10.1007/s10751-021-01756-0
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Study of obliquely deposited 57Fe layer on organic semiconductor (Alq3); interface resolved magnetism under x-ray standing wave

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Cited by 5 publications
(3 citation statements)
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“…Along with the isotope sensitivity GINRS technique can be made depth selective under the xray standing wave condition [25,35,36]. For this purpose, we have used 57 This 2D simulation is the distribution of x-ray filed intensity inside the waveguide structure.…”
Section: (F)mentioning
confidence: 99%
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“…Along with the isotope sensitivity GINRS technique can be made depth selective under the xray standing wave condition [25,35,36]. For this purpose, we have used 57 This 2D simulation is the distribution of x-ray filed intensity inside the waveguide structure.…”
Section: (F)mentioning
confidence: 99%
“…X-rays can be made available to probe the interface effectively by confining the X-rays intensity in a specific region along the depth using X-rays standing wave (XSW) generated for waveguide structure [32][33][34]. In some previous study [25,[35][36][37][38], the effectiveness of XSW for depth profiling of the interface using the grazing incidence nuclear forward scattering technique is demonstrated. By varying incidence angles, magnetic information was gained from the intended region.…”
Section: Introductionmentioning
confidence: 99%
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