Abstract:In this study on-machine measurement-assisted techniques are utilized in combination with micro-EDM to successfully machine intricate micro-parts. Two measurement approaches, automatic optical inspection (AOI) and critical contact measurement (CCM), are used on a previously built machine tool. AOI acquires the image from the contour of the machined workpiece and further processes the image to determine the finish allowance. CCM measures on-line the consumption of the microelectrode to create an accurate compen… Show more
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