1998
DOI: 10.1109/23.736510
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Study of low-dose-rate radiation effects on commercial linear bipolar ICs

Abstract: The results of a detailed study of the degradation of commercial linear bipolar ICs due to irradiation at four dose rates are presented. The time dependence of the degradation rate at the different dose rates is shown to be consistent with a model that describes a mechanism for defect generation in the devices used in this study. Based on this model, an accelerated test procedure for bipolar devices is proposed.

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Cited by 90 publications
(20 citation statements)
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“…This energy is very close to the activation energy found for the diffusion of molecular hydrogen in bulk fused silica (0.45 eV [25]) and the activation energy identified in the paper on enhanced low dose rate sensitivity in bipolar linear ICs (0.37 eV [26]). On the basis of these results, Shaneyfelt et al [27] have recently proposed possible model of the pre-irradiation elevated-temperature stress effects in bipolar ICs.…”
supporting
confidence: 66%
“…This energy is very close to the activation energy found for the diffusion of molecular hydrogen in bulk fused silica (0.45 eV [25]) and the activation energy identified in the paper on enhanced low dose rate sensitivity in bipolar linear ICs (0.37 eV [26]). On the basis of these results, Shaneyfelt et al [27] have recently proposed possible model of the pre-irradiation elevated-temperature stress effects in bipolar ICs.…”
supporting
confidence: 66%
“…This leads to enhanced low-dose-rate sensitivity (ELDRS) in these bipolar technologies. Several models have been proposed to explain ELDRS [18,19,20,21,22,23]. The most widely accepted model is a space-charge model [18,19,22,23].…”
Section: Project Description and Discussionmentioning
confidence: 99%
“…This technique is not universal and requires extensive characterization to select the optimum dose rate and irradiation temperature to provide an upper bound of the low dose rate response for those parts where the technique does work. Since then other methods have been suggested including repeated high dose rate irradiations followed by elevated temperature anneals [6], switched dose rate testing to reduce the total test time at low dose rate [7], and high dose rate irradiation on parts that have been exposed to molecular hydrogen [8], [9]. While the multiple cycles of high dose rate irradiation plus elevated temperature anneal Manuscript [8] and characterization using this approach continues.…”
Section: Introductionmentioning
confidence: 98%