An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative.Index Terms-Bipolar linear circuits, discrete bipolar transistors, dose rate, enhanced low-dose-rate sensitivity (ELDRS), hydrogen, radiation effects, total ionizing dose.