2014
DOI: 10.1117/12.2049395
|View full text |Cite
|
Sign up to set email alerts
|

Study of junction performance in mid-wavelength HgCdTe photodiodes by laser beam-induced current microscope

Abstract: This paper reports on the disappearance of photosensitive area extension effect and the novel temperature dependence of junction performance for mid-wavelength HgCdTe detectors. The performances of junction under different temperatures are characterized by laser beam induced current (LBIC) microscope. The physical mechanism of temperature dependence on junction transformation is elaborated and demonstrated using numerical simulations. It is found that Hg-interstitial diffusion and temperature activated defects… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 17 publications
(13 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?