2004
DOI: 10.1117/12.569743
|View full text |Cite
|
Sign up to set email alerts
|

Study of interface properties of electrodes for the Alq 3 base OLEDs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2009
2009
2009
2009

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…In this case spectroscopic methods such as scanning tunneling microscopy (STM) [12], transmission electron microscopy (TEM) [13], scanning electron microscopy (SEM) [14] and atomic force microscopy (ATM) [15] are used. Causes for device failures due to crystallization and inter diffusion of organic layers were reported by Adachi et al [16] and Han et al [17].…”
Section: Introductionmentioning
confidence: 99%
“…In this case spectroscopic methods such as scanning tunneling microscopy (STM) [12], transmission electron microscopy (TEM) [13], scanning electron microscopy (SEM) [14] and atomic force microscopy (ATM) [15] are used. Causes for device failures due to crystallization and inter diffusion of organic layers were reported by Adachi et al [16] and Han et al [17].…”
Section: Introductionmentioning
confidence: 99%