1998
DOI: 10.1063/1.368316
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Study of DX center in Cd0.8Zn0.2Te:Cl by positron annihilation

Abstract: Variable energy positron beam and positron annihilation lifetime experiments have been carried out to study the DX center in Cd 0.8 Zn 0.2 Te:Cl at 50 K. A short positron effective diffusion length of 275Ϯ25 Å and a large intensity of 79.0%Ϯ0.3% for the long lifetime component indicate a strong trapping effect at DX centers. A trapping rate of ϭ1.53Ϯ0.05ϫ10 9 s Ϫ1 and a positron lifetime of 335Ϯ2 ps at the DX center were obtained. The concentration of DX centers is found to be 5.9 Ϯ0.7ϫ10 16 cm Ϫ3 , which is i… Show more

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Cited by 12 publications
(5 citation statements)
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References 28 publications
(35 reference statements)
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“…For both donors, the shallow-donor and the DX-center energy lines intersect at a point above the CBM (see figures 6 and 7). Thus, the Cl and In DX centers are not stable unless the band gap can be increased by applying pressure or by alloying with Zn, as also found experimentally [59][60][61]. Our results show that the shallow donors are compensated by V Cd and A centers, not by DX centers.…”
Section: Energetics Of Shallow Donors: In and CLsupporting
confidence: 76%
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“…For both donors, the shallow-donor and the DX-center energy lines intersect at a point above the CBM (see figures 6 and 7). Thus, the Cl and In DX centers are not stable unless the band gap can be increased by applying pressure or by alloying with Zn, as also found experimentally [59][60][61]. Our results show that the shallow donors are compensated by V Cd and A centers, not by DX centers.…”
Section: Energetics Of Shallow Donors: In and CLsupporting
confidence: 76%
“…Thus, the Cl and In DX centers are not stable unless the band gap can be increased by applying pressure or by alloying with Zn, as also found experimentally. 58,59,60 Our results show that the shallow donors are compensated by V Cd and A centers, not by DX centers. The experimental observation of the DX centers in Cd 0.8 Zn 0.2 Te was made after annealing the sample in Cd vapor for several days, which eliminated both V Cd and A centers.…”
Section: )mentioning
confidence: 56%
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“…Such donor related lattice defects are called DX centers, which can cause the saturation of the free-electron carriers in the n-type semiconductors. [7][8][9][10][11][12][13][14][15] Structural models for DX centers associated with both group-III and group-VII donors in CdTe have been proposed, [16][17][18][19] which is similar to the brokenbond DX ͑BB-DX͒ model that was initially proposed for the DX centers in Si-doped AlGaAs alloys. However, the reverse structural transformation is subject to a thermal activation barrier, which gives rise to the persistent photoconductivity at low temperatures.…”
mentioning
confidence: 86%