2024
DOI: 10.1016/j.sse.2023.108833
|View full text |Cite
|
Sign up to set email alerts
|

Study of electrical transport properties in split-gate AlGaN/GaN heterostructure field-effect transistors

Heng Zhou,
Yuanjie Lv,
Chao Liu
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 24 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?