2019
DOI: 10.7567/1347-4065/ab09de
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Study of AlN based materials grown on nano-patterned sapphire substrates for deep ultraviolet LED applications

Abstract: High quality and crack-free AlN films were obtained by using nano-patterned sapphire substrates (NPSS) grown at AMEC Prismo HiT3 TM MOCVD platform. It is believed that the introduced epitaxial lateral overgrowth can annihilate most of dislocations and the grain boundary induced tensile stress can be significantly suppressed by NPSS. For a 5 μm thick AlN film, FWHMs of 173 arcsec and 335 arcsec were observed from AlN ( 002) and (102) X-ray rocking curves, respectively, indicating the high crystalline quality. T… Show more

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Cited by 12 publications
(8 citation statements)
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“…Since growth and doping required both accuracy and fine control of fluxes, epitaxy is used as the main deposition technique for LED fabrication. In this way, there are three epitaxial techniques more used such as molecular beam epitaxy (MBE), migration enhanced epitaxy (MEE), and metalorganic chemical vapor deposition (MOCVD) [141][142][143][144]. Besides, the development of combined methods based on MBE, MEE, and MOCVD, such as metal-source flow-rate modulation epitaxy, are of interest as long as Nitrogen flux remains constant reducing the activation energy of accep-tors and smooth surfaces could be produced [145].…”
Section: P-type Doping and Ohmic Contactsmentioning
confidence: 99%
“…Since growth and doping required both accuracy and fine control of fluxes, epitaxy is used as the main deposition technique for LED fabrication. In this way, there are three epitaxial techniques more used such as molecular beam epitaxy (MBE), migration enhanced epitaxy (MEE), and metalorganic chemical vapor deposition (MOCVD) [141][142][143][144]. Besides, the development of combined methods based on MBE, MEE, and MOCVD, such as metal-source flow-rate modulation epitaxy, are of interest as long as Nitrogen flux remains constant reducing the activation energy of accep-tors and smooth surfaces could be produced [145].…”
Section: P-type Doping and Ohmic Contactsmentioning
confidence: 99%
“…Thus, the AlN epilayer is nearly stress-free. [17,36,40,42,43,46,53,56,[58][59][60]62,69,73,74,76,79,81,94,[98][99][100][101][102][103][104][105][106][107][108][109] It is noted that there has been no unified standard for the evaluation of TDD. X-ray rocking curve (XRC) scan is the most common method to evaluate TDD.…”
Section: Quasi-van Der Waals Epitaxy (Qvdwe)mentioning
confidence: 99%
“…Figure 23. Selected AlN/sapphire TDD by year of publication[17,36,40,42,43,46,53,56,[58][59][60]62,69,73,74,76,79,81,94,[98][99][100][101][102][103][104][105][106][107][108][109]. The ultralow TDD value of 3.4 × 10 7 cm −2 has been achieved by ELOG growth technique in 2006.…”
mentioning
confidence: 99%
“…They have been widely used in various applications, such as traffic signals, full color displays, and back lights in liquid crystal displays. [1][2][3] Although GaN-based LEDs with high brightness are commercially available, the light output power of these LEDs is still limited by low internal quantum efficiency and light extraction efficiency. [4][5][6][7] Generally, a conventional GaN-based LED is grown on sapphire substrates in spite of the fact that the two have a lattice and coefficient of thermal expansion mismatch of 16% and 34%, respectively.…”
Section: Introductionmentioning
confidence: 99%