1996
DOI: 10.1346/ccmn.1996.0440205
|View full text |Cite
|
Sign up to set email alerts
|

Study of a Commercial SiO2 Sol and Gel By Small Angle X-Ray Scattering: Effect of Sample Thickness and Interpretation by Means of Smoluchowski Scheme

Abstract: Abstract--Ludox HS Sit 2 sols at high concentrations show a peak in small angle x-ray scattering (SAXS) reminiscent to a "structure." The appearance of such a peak was found to depend crucially on the thickness of the sample cell used for SAXS measurements. The thinner the cell used, the more prominent the peak. When the thickness was larger than 2 rnm, it was no longer observable. When sols were treated with activated charcoal powders (in order to remove a surfactant) the peak became less prominent.For the ca… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
5
0

Year Published

1997
1997
2015
2015

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 7 publications
(6 citation statements)
references
References 35 publications
1
5
0
Order By: Relevance
“…Nevertheless, notwithstanding these constraints, the interpretation of fluorescence anisotropy we have proposed for probes bound to nanoparticles has been validated for the initial stages of silica gelation. In this case it has been shown to be consistent with what is known about the growth of silica nanoparticles from a variety of other techniques [4][5][6][7][8][9] and indeed is already finding broader application such as in studying the surface modification of silica [20,21].…”
Section: Theorysupporting
confidence: 78%
See 1 more Smart Citation
“…Nevertheless, notwithstanding these constraints, the interpretation of fluorescence anisotropy we have proposed for probes bound to nanoparticles has been validated for the initial stages of silica gelation. In this case it has been shown to be consistent with what is known about the growth of silica nanoparticles from a variety of other techniques [4][5][6][7][8][9] and indeed is already finding broader application such as in studying the surface modification of silica [20,21].…”
Section: Theorysupporting
confidence: 78%
“…Methods used for nanoparticle metrology include small angle x-ray scattering (SAXS) [4,5], small angle neutron scattering (SANS) [6], transmission electron microscopy (TEM) [7], light scattering [8], spectroturbidimetric methods [9] and electrospray [10]. However, all of these have drawbacks including SAXS and SANS being expensive and complex, TEM not being in situ and light scattering being increasingly difficult below 10 nm radius, which is a size that includes many of the new nanoparticles such as quantum dots, fullerenes and carbon nanotubes.…”
Section: Introductionmentioning
confidence: 99%
“…Small-Angle and Ultra-Small-Angle X-ray Scattering. Scattering techniques can be used to probe the different length scales involved in these charged platelike particles and their structural arrangements. SAXS and ultra-SAXS (USAXS) measurements were carried out at the High-Brilliance Beamline (ID2) at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France . SAXS measurements were performed using a pinhole camera with a two-dimensional (2-d) detector, and USAXS profiles were obtained by a Bonse-Hart camera with two crossed-analyzers.…”
Section: Methodsmentioning
confidence: 99%
“…Figure 2 (Xu et al 1996) shows the sol-gel diagram in the pH-SiO2 concentration field, valid from 2 weeks to at least 6 mo. On changing the pH value, the sample remained as a stable sol at first, and after some induction period of hours to days, depending on the conditions, the sample lost fluidity and turned into gel rather suddenly.…”
Section: Resultsmentioning
confidence: 99%