Study of a BIST Technique for CMOS Active Pixel Sensors

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors

“…In the literature, some solutions have been proposed to embed test facilities inside a CIS and hence save test time. Authors in [14][15][16] and in [17][18] propose to reduce the amount of optical tests and proceed with a fully electrical test set so as to avoid precise and restrictive settings needed in optical tests. Authors in [14], [15] and [16] propose a solution based on the generation of a pulse (voltage stimuli) which is sent on the anode of the photodiode inside the pixel to simulate the light illumination.…”

“…Authors in [14][15][16] and in [17][18] propose to reduce the amount of optical tests and proceed with a fully electrical test set so as to avoid precise and restrictive settings needed in optical tests. Authors in [14], [15] and [16] propose a solution based on the generation of a pulse (voltage stimuli) which is sent on the anode of the photodiode inside the pixel to simulate the light illumination. Authors indicate that the implementation of this method is very dependent on the pixel architecture.…”

“…Note that all these BIST solutions in [14][15][16][17][18] aimed at reducing optical test time, a common objective with the BIST solution proposed in this paper.…”