2022
DOI: 10.3390/ma15062116
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Studies on Electron Escape Condition in Semiconductor Nanomaterials via Photodeposition Reaction

Abstract: In semiconductor material-driven photocatalysis systems, the generation and migration of charge carriers are core research contents. Among these, the separation of electron-hole pairs and the transfer of electrons to a material’s surface played a crucial role. In this work, photodeposition, a photocatalysis reaction, was used as a “tool” to point out the electron escaping sites on a material’s surface. This “tool” could be used to visually indicate the active particles in photocatalyst materials. Photoproduced… Show more

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Cited by 2 publications
(1 citation statement)
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“…The authors of [24] explored the effect of Al 2 TiO 5 content and sintering temperature on the microstructure and residual stress of Al 2 O 3 -Al 2 TiO 5 ceramic composites, and the effects of material design and sintering process on residual stresses were expounded from macro-and micro-levels. The authors of [25] studied the electron escape condition in semiconductor nanomaterials via photodeposition reaction. The authors of [26] prepared the boron nitride ceramic fibers containing amounts of silicon nitride using hybrid precursors of PBN and PCS via melt-spinning, curing, decarburization under NH 3 to 1000 • C and pyrolysis up to 1600 • C under N 2 .…”
mentioning
confidence: 99%
“…The authors of [24] explored the effect of Al 2 TiO 5 content and sintering temperature on the microstructure and residual stress of Al 2 O 3 -Al 2 TiO 5 ceramic composites, and the effects of material design and sintering process on residual stresses were expounded from macro-and micro-levels. The authors of [25] studied the electron escape condition in semiconductor nanomaterials via photodeposition reaction. The authors of [26] prepared the boron nitride ceramic fibers containing amounts of silicon nitride using hybrid precursors of PBN and PCS via melt-spinning, curing, decarburization under NH 3 to 1000 • C and pyrolysis up to 1600 • C under N 2 .…”
mentioning
confidence: 99%