2022
DOI: 10.3762/bjnano.13.104
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Studies of probe tip materials by atomic force microscopy: a review

Abstract: As a tool that can test insulators' surface morphology and properties, the performance index of atomic force microscope (AFM) probes is the most critical factor in determining the resolution of microscopy, and the performance of probes varies in various modes and application requirements. This paper reviews the latest research results in metal, carbon nanotube, and colloidal probes and reviews their related methods and techniques, analyses the advantages and disadvantages of the improved probes compared with o… Show more

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Cited by 6 publications
(9 citation statements)
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References 53 publications
(52 reference statements)
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“…MFM is a special AFM operational mode, which uses a flexible cantilever with a tip consisting of a magnetic material [100,238]. The AFM tip geometry and material vary depending on the final experimental purpose, and the fundamentals of the AFM probe selection rely on the measured physico-chemical properties [239]. The cantilever bends when touching the sample surface following the linear-Hookean force law [240]:…”
Section: Working Principles Of Mfmmentioning
confidence: 99%
See 1 more Smart Citation
“…MFM is a special AFM operational mode, which uses a flexible cantilever with a tip consisting of a magnetic material [100,238]. The AFM tip geometry and material vary depending on the final experimental purpose, and the fundamentals of the AFM probe selection rely on the measured physico-chemical properties [239]. The cantilever bends when touching the sample surface following the linear-Hookean force law [240]:…”
Section: Working Principles Of Mfmmentioning
confidence: 99%
“…MFM is a special AFM operational mode, which uses a flexible cantilever with a tip consisting of a magnetic material [ 100 , 238 ]. The AFM tip geometry and material vary depending on the final experimental purpose, and the fundamentals of the AFM probe selection rely on the measured physico-chemical properties [ 239 ]. The cantilever bends when touching the sample surface following the linear-Hookean force law [ 240 ]: where F is the sensed force, k corresponds to the cantilever spring constant, and Δ z refers to the cantilever deflection, which is the direction perpendicular to the scanning plane and sample.…”
Section: Working Principles Of Mfmmentioning
confidence: 99%
“…The interaction between the tip and sample influences the measurement results of AFM by convoluting the tip topography with the sample surface topography [ 7 ]. A sharper needle tip leads to more accurate measurements [ 8 ]. During the scanning process, tip and sample come into mutual contact, causing wear on the tip [ 9 ].…”
Section: Introductionmentioning
confidence: 99%
“…Existing reviews on AFM probe modification techniques either focus solely on one type of modification technique, 54,55 or do not summarize the corresponding preparation methods. 56 More importantly, there is a lack of introductions to specific application scenarios. In current reviews, probe modification techniques and their applications are often treated as separate entities, which clearly hinders the application and development of the technology.…”
Section: Introductionmentioning
confidence: 99%