2015
DOI: 10.1016/j.synthmet.2015.05.016
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Studies of photosensitivity and photo-induced negative differential resistance (NDR) of TIPS-pentacene-poly(3-hexyl)thiophene blend organic thin film transistor

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Cited by 8 publications
(7 citation statements)
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“…While SGTs are renowned for their ability to achieve record‐high intrinsic gain (reaching ≈10 5 in SGTs based on polycrystalline silicon), [ 40 ] some of the OSGT output characteristics demonstrate an appreciable negative differential resistance (NDR), which increases with V OV (Figure 2d). In TFTs, NDR typically occurs due to trap states at the semiconductor‐insulator interface in the channel region; [ 41,42 ] however, the OTFT results here do not display any NDR. Seeing that SGTs are contact‐controlled devices, the presence of trap states at the semiconductor‐insulator interface is unlikely to be the case.…”
Section: Source‐gated Transistors Versus Thin‐film Transistors: Opera...mentioning
confidence: 73%
“…While SGTs are renowned for their ability to achieve record‐high intrinsic gain (reaching ≈10 5 in SGTs based on polycrystalline silicon), [ 40 ] some of the OSGT output characteristics demonstrate an appreciable negative differential resistance (NDR), which increases with V OV (Figure 2d). In TFTs, NDR typically occurs due to trap states at the semiconductor‐insulator interface in the channel region; [ 41,42 ] however, the OTFT results here do not display any NDR. Seeing that SGTs are contact‐controlled devices, the presence of trap states at the semiconductor‐insulator interface is unlikely to be the case.…”
Section: Source‐gated Transistors Versus Thin‐film Transistors: Opera...mentioning
confidence: 73%
“…When the OPT operates in conduction, including both subthreshold and over-threshold regions, the increase of the drain current with illumination is linked to a modification of the threshold voltage ∆V T . This modification can be associated to an accumulation of trapped photogenerated charges at the organic-insulator interface [49][50][51] or in layers close to the contact regions [52], with a high concentration of defects and traps, in which excitons are photogenerated and subsequently free charges are separated. In the semiconductor bulk, far from these layers and interfaces, the exciton recombination is high due to the absence of high electric fields.…”
Section: Threshold Voltage V Tmentioning
confidence: 99%
“…This is the axis that the computing manufacturing is transferring towards. Recently, we have shown different applications concerning CNTs [ 11 – 14 ] as we will see later. SWNTs are believed to possess strong mechanical properties due to strong covalent bond among the carbon atoms [ 1 ] (Tables 1 and 2 ).…”
Section: Reviewmentioning
confidence: 99%