Studies of Molecular Orientation in Deformed Semicrystalline Polymers by X- Ray Scattering Employing Synchrotron Radiation

Abstract

IntroductionThe possibility of using synchrotron radiation as a source of X-rays for scattering experiments has considerably improved the methods of the characterisation of the molecular orientation and molecular order in polymers. In another publication [1], it has been shown that the morphology of ultra highly drawn polyethylene is correlated to the kinetics of isothermal melting, as determined by X- ray scattering employing synchrotron radiation. In this paper we present some results on chain orientation and orientation of crystal lamellae surfaces in uniaxially and biaxially drawn films of polyethyleneterephthalate (PET). These results were obtained by inserting a pole figure goniometer into the synchrotron radiation beam and measuring the wide angle X-ray scattering (WAXS) and small angle X- ray scattering (SAXS) with different angles of incidence of the primary beam onto the sample.