2011
DOI: 10.1016/j.surfcoat.2011.01.019
|View full text |Cite
|
Sign up to set email alerts
|

Studies of hysteresis effect in reactive HiPIMS deposition of oxides

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
30
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 60 publications
(30 citation statements)
references
References 13 publications
0
30
0
Order By: Relevance
“…Furthermore, the high peak target current in HiPIMS results in rarefaction of the neutral species in the target's vicinity, as discussed in Section II C, which affects not only Ar gas but also the reactive gas. 87,88 The rarefaction implies that the reactive species flux F is lower than the value corresponding to the nominal partial pressure of the reactive gas. 87,88 …”
Section: F Reactive Hipimsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, the high peak target current in HiPIMS results in rarefaction of the neutral species in the target's vicinity, as discussed in Section II C, which affects not only Ar gas but also the reactive gas. 87,88 The rarefaction implies that the reactive species flux F is lower than the value corresponding to the nominal partial pressure of the reactive gas. 87,88 …”
Section: F Reactive Hipimsmentioning
confidence: 99%
“…87,88 The rarefaction implies that the reactive species flux F is lower than the value corresponding to the nominal partial pressure of the reactive gas. 87,88 …”
Section: F Reactive Hipimsmentioning
confidence: 99%
“…The rarefaction affects not only the Ar but also the reactive gas species [12,15]. It has been suggested in the literature [13,16] that the latter has as a consequence a lower effective flux of reactive species towards the target which in turn results in the elimination/suppressions of the hysteresis and the stabilization of the transition zone in reactive HiPIMS processes. The decrease of the pulsing frequency for a constant average power (or current) leads to larger peak target currents and thus more pronounced gas rarefaction.…”
Section: Process Characteristicsmentioning
confidence: 99%
“…The observed behavior has been attributed to several mechanisms, i.e. depletion of reactive gas in front of the target during the pulse ontime [13,15,16] (referred to as gas rarefaction [17][18][19][20][21]), limited target oxidation during the pulse off-time [13], and higher target erosion rate due to the higher target voltage used in HiPIMS as compared to DCMS [14]. However, the question regarding the origin of the process stabilization in reactive HiPIMS still remains.…”
Section: Introductionmentioning
confidence: 99%
“…The most important experimental parameter is the target size along with some other deposition parameters such as pumping speed, sputtering gas pressure, pulsing frequency, and duty cycle for the case of HiPIMS. [9,11].…”
Section: Introductionmentioning
confidence: 99%