“…Spectroscopic ellipsometry is a convenient technique for analyzing thin films − because of the speed of the measurements, as well as the automation of both the data collection and analysis. Ellipsometry has been used to study a variety of polymer thin film phenomena occurring in both air and liquid solvents including adsorption of polymers and surfactants on to surfaces, − glass transition temperatures, ,,, diffusion in thin films, , and swelling of polymer films. ,− In addition, Schmidt and Moldover measured the thickness of vapor−liquid interfaces of several compounds near their critical points using ellipsometry and Hayfield used ellipsometry to monitor high-pressure gas and liquid reactions.…”