Structure of the sulfurKx-ray emission spectrum: influence of the oxidation state

Abstract

The sulfur K x-ray emission was studied in pure sulfur, anhydrite (CaSO 4) and sphalerite (ZnS) samples. The ionizations were induced by electron impact and the spectra were recorded with a wavelength dispersive spectrometer. The spectral processing was performed through a methodology based on the optimization of atomic and experimental parameters. Energies and intensities of diagram and satellite lines were determined for a set of transitions in the Kα and Kβ groups. The lines studied include Kα 22

Experimental determination of multiple ionization cross sections in Si by electron impact

“…Thus, some parameters like natural linewidth, energy, and transition probability are very correlated. To avoid this obstacle, a strategy based on keeping a constant ratio between Kα 1 and Kα 2 intensities was followed [2,19]. A Voigt profile [28] was used for every line except for the RAE structure, for which a convolution between the expression given by Enkisch [29] and a Gaussian profile was used.…”

“…On the other hand, the measurement of cross sections for low probability phenomena, for example multiple-ionization processes, has deserved the attention and effort of several researchers [11][12][13][14][15], in view of their application to the description of the x-ray emission spectrum. Particularly, the production of satellite lines (arising by either molecular transitions or multiple ionizations) is important in analytical techniques based on x-ray emission: their correct prediction and measurement can be applied to compound speciation and to the validation of molecular orbital theories [16][17][18][19].…”

Effect of surfactant on optical and structural properties of chemically deposited MoBi2S5 thin films

“…We have confirmed the presence of Mo and S on the basis of multipeak patterns. 26 TOPO has the capability to synthesise high quality nanocrystals. 27 The size of the nanocrystal is controlled by adsorbing long-chain surfactant molecules onto the nanocrystal surface, forming micelle structures.…”

Experimental x-ray-production cross sections for the M3, M4 , and M5 subshells of Pt and Au by electron impact

“…To this purpose, x-ray spectra induced by keV-electron impact were measured at different beam energies with an energy-dispersive detector. These spectra were then processed by means of a robust optimization procedure implemented in a previous work [20] and successfully used for the determination of different atomic parameters [21][22][23][24][25]. In this approach, the values for the x-ray-production cross sections were assessed from the prediction of characteristic spectra on the basis of ionization depth distribution functions [26], and therefore no simplifications were required regarding either the electron trajectories within the material or backscattering losses.…”