Structure of Phosphorus Oxynitride Glasses

Bunker, Bruce C.; Tallant, D. R.; Balfe, Carol A.; Kirkpatrick, R. James; Turner, Gary L.; Reidmeyer, Mary R.

doi:10.1111/j.1151-2916.1987.tb05738.x

Cited by 113 publications

(78 citation statements)

References 7 publications

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“…Based on the structural model from Bunker et al (1987), every two P-N< P P structural units created in the structure for three P-O bonds are destroyed, while one P-O bond has to be removed to form two P-N=P structural units (figure 9). Compared with two P-N=P structural units, two P-N< P P structural units would remove two more P-O bonds, which is less covalent than P-N bond.…”

Section: Resultsmentioning

confidence: 99%

Influence of radio frequency power on structure and ionic conductivity of LiPON thin films

Xie

2008

Bull Mater Sci

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Lithium phosphorus oxynitride (LiPON) thin films as solid electrolytes were prepared by radio frequency magnetron sputtering of a Li 3 PO 4 target in ambient nitrogen atmosphere. The influence of radio frequency (rf) power on the structure and the ionic conductivity of LiPON thin films has been investigated. The morphology, composition, structure and ionic conductivity of thin films were characterized by scanning electron microscopy, energy dispersive spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy and a.c. impedance measurement. It was found that ionic conductivity of LiPON thin films increases with N content in thin films. XPS measurements reveal that ionic conductivity also keeps relativity with the structure of thin films. Higher the N t /N d ratio, higher will be the ionic conductivity of LiPON thin films. And both of them can be improved by increasing rf power from 1⋅5 W/cm 2 to 5⋅5 W/cm 2 .

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Section: Resultsmentioning

confidence: 99%

Influence of radio frequency power on structure and ionic conductivity of LiPON thin films

Xie

2008

Bull Mater Sci

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“…[58][59][60][61][62][63][64] The decomposition of melts containing P 2 O 5 and N restricts their processing to much lower temperatures (<900 • C) than the silicates. Si-free phosphorus oxynitride glasses have been successfully produced by introduction of nitrogen into the melt using metal nitrides (mostly AlN) or by re-melting phosphate glass frits with the general formula MPO 3−3x N 2x (M = Li, Na, K) under anhydrous ammonia.…”

Section: Phosphorus Oxynitride Glassesmentioning

confidence: 99%

Oxynitride glasses

Hampshire

2008

Journal of the European Ceramic Society

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Oxynitride glasses are silicates and alumino-silicates in which nitrogen atoms substitute for oxygen in the glass network. They are present as intergranular films and at triple points within the microstructures of silicon nitride-based ceramics as a result of the cooling of liquid phases formed by reaction of sintering additives with the nitride and surface silica. Oxynitride glass chemistry and volume fractions determine the type of microstructure developed and hence the properties of silicon nitride and sialons. In particular, they affect strength and fracture toughness and the control of high temperature creep behaviour. The desire to understand the nature of these grain boundary phases has resulted in a number of investigations on oxynitride glass formation, structure, properties and crystallisation which have shown that they have higher glass transition temperatures, elastic moduli, viscosities and values of hardness and lower thermal expansion coefficients than the corresponding oxide glasses. This paper reviews the development of oxynitride glasses and outlines the effect of glass composition, especially nitrogen content and also cation ratios, on properties and relates this to structural features within the glass. Nucleation and crystallisation studies are also outlined.

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“…Nuclear magnetic resonance has evidenced formation of two new structural units, the PO 3 N and PO 2 N 2 tetrahedra, [23][24][25][26] in which the nitrogen atoms are coordinated to two phosphorous, N (N d ), or to three phosphorous, N (N t ), as shown by X-ray photoelectron spectroscopy. 26,27 The presence of glassy phases in the grain boundaries of silicon nitride-based ceramics has led to study the formation conditions of such glass compositions and their properties as a function of the nitrogen content.…”

Section: Introductionmentioning

confidence: 98%