2008
DOI: 10.1016/j.msea.2007.10.006
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Structure of diamond–silicon carbide nanocomposites as a function of sintering temperature at 8GPa

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Cited by 11 publications
(9 citation statements)
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“…The peak broadening of primary is relatively small, similar to the broadening observed in the ASR material ( Fig. 8), while the reflections of the martensitic components are much broader and also show a strong strain broadening with a high dislocation population (Ungá r, 2008). In addition, it can be seen that the 00.2 and 00.4 peaks of martensitic are significantly less wide than the other non-basal reflections.…”
Section: Figuresupporting
confidence: 74%
See 1 more Smart Citation
“…The peak broadening of primary is relatively small, similar to the broadening observed in the ASR material ( Fig. 8), while the reflections of the martensitic components are much broader and also show a strong strain broadening with a high dislocation population (Ungá r, 2008). In addition, it can be seen that the 00.2 and 00.4 peaks of martensitic are significantly less wide than the other non-basal reflections.…”
Section: Figuresupporting
confidence: 74%
“…The modeled theoretical whole diffraction pattern is fitted to the measured data by refining the parameters of the microstructure until a solution is found (Leoni et al, 2004;Scardi et al, 2010;Ribá rik et al, 2004;. These methods are routinely used to quantitatively characterize the defect structure of cubic and hexagonal materials, including alloys having industrial applications (Pantea et al, 2004;Má this et al, 2004;Schafler et al, 2005;Nyilas et al, 2006;Balogh et al, 2008;Kerber et al, 2009;Balogh, Brown et al, 2012;Mayer et al, 2012).…”
Section: Introductionmentioning
confidence: 99%
“…X-ray diffraction peak profile analysis was carried out to determine the crystallite size distribution and the dislocation substructure of the nanocomposites studied using the CMWP fitting procedure program. We have assumed that strain is caused by dislocations [8]. The lattice parameters of the various nanocomposites were obtained from the positions of the X-ray diffraction peaks calculated by the Rietveld method.…”
Section: Methodsmentioning
confidence: 99%
“…Until recently, different procedures have been used for the evaluation of X-ray diffraction profiles or patterns. The convolutional multiple whole profile (CMWP) method, produces the convolutions of model-based, phys- ically well-established size and strain profiles and that of the instrumental profiles, and compares the so constructed and the measured diffraction patterns by using a non-linear least squares fitting procedure [7,8].…”
Section: Introductionmentioning
confidence: 99%
“…Também identificaram que a ausência de picos devido ao silício indicava que a reação estava completa. O não aparecimento de grafite confirmava que a sinterização foi realizada na região em que o diamante estava na forma estável do carbono [5].…”
Section: Difração De Raios-x (Drx)unclassified