2008
DOI: 10.1088/0953-8984/20/24/244109
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Structure factor determination of amorphous materials by neutron diffraction

Abstract: An introduction is given to structure factor determination by means of neutron diffraction. The method of isotopic substitution, which allows us to separate the partial correlation functions, is also presented. Suitable instruments, the experimental procedures, and corrections are described. Other less-conventional techniques such as isomorphic substitution and anomalous dispersion are also discussed. Finally, examples of the structure factor determination in chalcogenide, molecular, telluride and phosphate gl… Show more

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Cited by 33 publications
(33 citation statements)
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“…[60][61][62] The program Correct was used to perform the data reduction and corrections. 63,64 The total structure factor is given by 65 iðQÞ¼…”
Section: Neutron Diffraction Methods and Analysismentioning
confidence: 99%
“…[60][61][62] The program Correct was used to perform the data reduction and corrections. 63,64 The total structure factor is given by 65 iðQÞ¼…”
Section: Neutron Diffraction Methods and Analysismentioning
confidence: 99%
“…In order to correct and normalize the data, the empty cryostat, an empty sample holder, a boron powder sample, and a vanadium rod were also measured, as in previous works. 37,38 Absorption and multiple-scattering corrections and normalization of the data were performed using the program CORRECT. 39 Additionally, inelastic corrections were also carried out by subtracting a polynomial expansion in powers of q 2 .…”
Section: B Neutron Diffraction Experimentsmentioning
confidence: 99%
“…These materials have no intrinsic structural length scale despite the interatomic distance, as can be probed by measuring its static structure factor 1 or, equivalently, pair correlation function. It includes amorphous semiconductors like silicon, 2,3 oxide glasses like silica and silicate glasses, 4 metallic glasses, 5 and other disordered assemblies like colloidal glasses.…”
Section: Introductionmentioning
confidence: 99%