Structure, dielectric, and piezoelectric properties of Ba0.87Ca0.13 (Ti0.9Zr0.1) (1–x) (Zn1/3Nb2/3)x O3 ceramics

AC conductivity and phase transition of the BST–BFO ceramic doped with Yb

“…At room temperature (RT), X-ray diffraction (XRD) patterns were obtained on a Siemens D5000 diffractometer using Cu K emission ¼ 1.5460 Å in the angular range of 10 < 2q < 80 with 10 s for each step of 0.02 around the structure to determine the composition. The FullProf [19][20][21] soware was used to analyze the XRD proles. The morphologies and sizes of the samples were studied directly with a Hitachi SU70 Merlin SEM at an acceleration voltage of 3 kV, equipped with an EDXS energy-dispersive X-ray spectrometer, which was used for the elemental analysis of the different phases.…”