1999
DOI: 10.1103/physrevb.59.13014
|View full text |Cite
|
Sign up to set email alerts
|

Structure determination of the(3×3)R30°bor

Abstract: A quantitative structural analysis of the system Si(111)(ͱ3ϫͱ3)R30°-B has been performed using photoelectron diffraction in the scanned energy mode. We confirm that the substitutional S 5 adsorption site is occupied and show that the interatomic separations to the three nearest-neighbor Si atoms are 1.98(Ϯ0.04) Å , 2.14(Ϯ0.13) Å , and 2.21(Ϯ0.12) Å . These correspond to the silicon atom immediately below the boron atom, the adatom immediately above, and the three atoms to which it is coordinated symmetrically … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

8
14
0

Year Published

2002
2002
2024
2024

Publication Types

Select...
5
3

Relationship

0
8

Authors

Journals

citations
Cited by 31 publications
(22 citation statements)
references
References 44 publications
8
14
0
Order By: Relevance
“…This latter atom is predicted to be at a distance of 1.98 Å, in excellent agreement with the recent experimental value of 1.98Ϯ0.04 Å. 25 The distance between the Si(T 4 ) adatom and the B(S 5 ) atom is 2.18 Å. The position of the third-layer silicon atom is seen to be almost unaffected by the presence of the chemisorbed B(S 5 ) atom.…”
Section: B Geometrysupporting
confidence: 86%
“…This latter atom is predicted to be at a distance of 1.98 Å, in excellent agreement with the recent experimental value of 1.98Ϯ0.04 Å. 25 The distance between the Si(T 4 ) adatom and the B(S 5 ) atom is 2.18 Å. The position of the third-layer silicon atom is seen to be almost unaffected by the presence of the chemisorbed B(S 5 ) atom.…”
Section: B Geometrysupporting
confidence: 86%
“…Therefore, a halffilled DB-based surface state appears inside the gap giving a metallic character to this originally semi-conducting surface [1,2]. In boron-enriched (p-doped) silicon materials, the segregation of B dopants at surface leads to a √ 3 × √ 3R30 surface reconstruction associated with a surface metal-insulator transition in agreement with band structure calculations [3,4]. Doping this interface with alkali atoms (electron donors) leads to completely different physical properties [5,6].…”
Section: Introductionsupporting
confidence: 54%
“…A boron enriched surface has been obtained following the procedure described in the section devoted to the experimental details. Previous photodiffraction measurements [3] and ab initio calculations [4] have clearly established the occupation of the pentavalent S 5 sub-surface site by boron atoms leading to the well known √ 3 × √ 3 surface reconstruction, the surface hexagonal unit cell being 30 degrees turned compare to the initial (1 × 1) unit cell. The presence of the surface reconstruction has been monitored by STM at 80 K and LEED in the 80-300 K range as presented in Fig.…”
Section: Resultsmentioning
confidence: 94%
“…On the other hand, 1=4 of the Si adatoms remains undisplaced since they are situated far away from the K adatoms (d K-Si ¼ 5:11 # A). In this later case, the Si adatom-B bond length of 2.16 Å corresponds to what has been measured and calculated for the Si:B substrate [26,27]. As a consequence, an alternation of short (2.16 Å ) and long (2.93 Å ) Si adatom-B bonds or equivalently of elongated and undistorted Si tetrahedra is observed on the hexagonal lattice leading to the expected 2 ffiffiffi 3 p surface reconstruction.…”
supporting
confidence: 75%
“…1(a) for K=Si:B films, their respective area approaching the ratio 1=3. A unique boron site (noticed S 5 ) characterizing the ffiffiffi 3 p reconstruction of the Si:B substrate is expected [26,27]. A global shift of 0.52 eV of the B 1s spectra toward higher binding energy upon K deposition has been also observed for both Si 2p core levels and valence band spectra and has been interpreted as a band bending effect due to the formation of the alkali-metal/Si:B interface [25].…”
mentioning
confidence: 92%