Structure at polymer interfaces determined by high-resolution nuclear reaction analysis

Abstract

Analysis of initial stage of PdSi (111) and AuSi (111) interface reactions by means of highresolution proton energy loss spectroscopy

Effect of deuterium substitution on the surface interactions in binary polymer mixtures

“…In each binary mixture components have different fractions (expressed as percentages) x 1 , x 2 of the EE group, and one component is labeled by deuterium (dx) while the other is hydrogenous (hx). The composition-depth profiles of the deuterated 30 or hydrogenated 27 component within the samples (normal to the free surface) were determined using nuclear reaction analysis. 30 The change of surface enrichment upon the exchange of the blend component labeled by deuterium is observed for pairs x 1 /x 2 of isostructural mixtures (dx 1 /hx 2 , hx 1 / dx 2 ).…”

“…The composition-depth profiles of the deuterated 30 or hydrogenated 27 component within the samples (normal to the free surface) were determined using nuclear reaction analysis. 30 The change of surface enrichment upon the exchange of the blend component labeled by deuterium is observed for pairs x 1 /x 2 of isostructural mixtures (dx 1 /hx 2 , hx 1 / dx 2 ). This label-swapping effect is illustrated by Figure 1(a) and (b) for the blend pairs 66/52 and 86/75, respectively.…”

Surface-directed phase separation in nanometer polymer films: self-stratification and pattern replication

“…In NRA (Fig. 3a) [43,44] energetic (E ≈ 1 MeV) 3 He ions penetrate easily the film until they encounter 2 H atoms labelling one of the blend components. The energetic spectrum of the nuclear reaction (non-resonant, 3 He( 2 H, 1 H) 4 He) products ( 4 He or 1 H) provides the information on the profile φ(z) of the deuterated polymer.…”

“…3): Nuclear Reaction Analysis (NRA) [43,44], profiling [45][46][47] and mapping [13] mode of dynamic Secondary Ion Mass Spectroscopy (SIMS), and with Atomic Force Microscopy (AFM) combined with selective dissolution [15]. The free surface undulations were determined with AFM [48].…”

Interdiffusion measurements of modified poly(arylether sulfone)s using nuclear reaction analysis

“…Thus essential data tration as a function of the distance to the surface with a depth resolution of about 15 nm full width for the design of multiphase materials can be obtained by evaluating diffusion and miscibility behalf maximum (FWHM) at the surface of polymer samples. 11 The energy spectra of the outgoing a havior quantitatively. In order to tackle this problem, the modified PSUs are used in two-layer particles from the nuclear reaction were measured by means of a silicon surface barrier detecspecimens with deuterated PSU (d-PSU) for nuclear reaction analysis (NRA).…”