Structure and properties of epitaxial ferroelectric PbZr0.4Ti0.6O3∕PbZr0.6Ti0.4O3 superlattices grown on SrTiO3 (001) by pulsed laser deposition

Vrejoiu, Ionela; Zhu, Yin; Rhun, G. Le; Schubert, Markus Andreas; Hesse, D.; Alexe, Marin

doi:10.1063/1.2643259

Cited by 39 publications

(19 citation statements)

References 29 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Such SLs may in a two dimensional fashion ''simulate'' the composition of the morphotropic phase boundary of PbZr x Ti 1-x O 3 for x ffi 0.5. A peculiar case of epitaxial MLs consisting of ultrathin layers of two alternating PbZr x Ti 1-x O 3 compositions, namely PZT40/60 (nominally tetragonal) and PZT60/40 (nominally rhombohedral, as bulk, at room temperature) was investigated by Vrejoiu et al [32] The PZT40/60/PZT60/40 MLs were grown on SrRuO 3 -coated vicinal SrTiO 3 (100) substrates by PLD. Significant structural transformations were observed by HR(TEM), XRD, and PFM in MLs with an individual layer thickness below ca.…”

Section: Ferroelectric-ferroelectric Superlatticesmentioning

confidence: 99%

Functional Perovskites – From Epitaxial Films to Nanostructured Arrays

Vrejoiu¹,

Alexe²,

Hesse³

et al. 2008

Adv Funct Materials

Self Cite

116

View full text Add to dashboard Cite

Functional perovskite materials gain increasing significance due to their wide spectrum of attractive properties, including ferroelectric, ferromagnetic, conducting and multiferroic properties. Due to the developments of recent years, materials of this type can conveniently be grown, mainly by pulsed laser deposition, in the form of epitaxial films, multilayers, superlattices, and well‐ordered arrays of nanoislands. These structures allow for investigations of preparation–microstructure–property relations. A wide variation of the properties is possible, determined by strain, composition, defect contents, dimensional effects, and crystallographic orientation. An overview of our corresponding work of recent years is given, particularly focusing on epitaxial films, superlattices and nanoisland arrays of (anti)ferroelectric and multiferroic functional perovskites.

show abstract

Section: Ferroelectric-ferroelectric Superlatticesmentioning

confidence: 99%

Functional Perovskites – From Epitaxial Films to Nanostructured Arrays

Vrejoiu¹,

Alexe²,

Hesse³

et al. 2008

Adv Funct Materials

Self Cite

116

View full text Add to dashboard Cite

show abstract

“…In the case of ferroelectrics, multilayers or superlattices have displayed enhanced polarization, [5][6][7] high dielectric permittivity [8,9] and in some instances, entirely new structural phases. [10] These observations have been accounted for on the basis of electric-field-induced coupling, [4] epitaxial strain, [11,12] and specific polar interactions between the interfacial layers.…”

mentioning

confidence: 99%

Labile Ferroelastic Nanodomains in Bilayered Ferroelectric Thin Films

et al. 2009

View full text Add to dashboard Cite

Bilayered Pb(Zr(1–x),Tix)O3 ferroelectric thin film heterostructures show complex ferroelastic nanodomain patterns. These ferroelastic nanodomains exist only in the upper layer, and hence are able to move under the application of an external electric field. Quantitative analysis reveals an enhanced piezoelectric coefficient of ≈220 pm V−1, rendering them attractive for a variety of electromechanical devices.

show abstract

“…The a/c domain walls are inclined by 45 relatively to the bottom interface, following the (101) and (À101) lattice planes. The formation of a-domains is a relaxation mechanism frequently observed in tetragonal perovskite thin films such as PbZr x Ti 1Àx O 3 (with x < 0.5), 26,27 which allows the modulation of the average in-plane parameter. However, the domain walls appear more diffuse and the inclination changes with respect to the {101} planes in a small region (%60 nm thick) just below the surface.…”

Section: Methodsmentioning

confidence: 99%

Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy

Denneulin

Maeng

Eom

et al. 2017

Journal of Applied Physics

View full text Add to dashboard Cite

Focused ion beam sample preparation for transmission electron microscopy (TEM) can induce relaxation mechanisms in epitaxial thin films. Here, we describe a relaxation mechanism that can occur in materials having a tetragonal structure. We investigated the lattice structure of a 600 nm thick 0.4[Pb(Mg1/3Nb2/3)O3]−0.6[PbTiO3] layer grown by epitaxy on (110) GdScO3 substrate using geometrical phase analysis applied to high resolution TEM images. The lattice mismatch at the interface is expected to favor the formation of c-domains. However, it was measured that the out-of-plane lattice parameter can decrease abruptly along the growth direction and the transition depends on the thickness of the TEM lamella. Different observations indicate that the crystal flipped by 90° following the preparation of the sample, so that the c-axis is oriented in the thinning direction. Such a mechanism can easily lead to misinterpretations and might happen in other materials with a similar structure.

show abstract

Structure and properties of epitaxial ferroelectric PbZr0.4Ti0.6O3∕PbZr0.6Ti0.4O3 superlattices grown on SrTiO3 (001) by pulsed laser deposition

Cited by 39 publications

References 29 publications

Functional Perovskites – From Epitaxial Films to Nanostructured Arrays

Functional Perovskites – From Epitaxial Films to Nanostructured Arrays

Labile Ferroelastic Nanodomains in Bilayered Ferroelectric Thin Films

Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy

Contact Info

Product

Resources

About