Structure and Magnetic Properties of CoPt, CoPd, FePt, and FePd Alloy Thin Films Formed on MgO(111) Substrates

Ohtake, Mitsuru; Ouchi, Shouhei; Kirino, Fumiyoshi; Futamoto, Masaaki

doi:10.1109/tmag.2012.2198875

Cited by 41 publications

(36 citation statements)

References 6 publications

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“…However in order to achieve a high order degree, it is necessary to employ a high temperature processing. Film deposition at a high substrate temperature tends to enhance the film surface roughness due to migration and clustering of deposited atoms [1]. The control of c-axis distribution is also required for fabrication of magnetic film devices.…”

Section: Introductionmentioning

confidence: 99%

“…In order to investigate the L1 0 crystal distribution, a welldefined epitaxial film is useful, since the crystallographic orientation can be controlled by single-crystal substrate. FePd [1][2][3][4], FePt [1,[5][6][7][8], and CoPt [1,[9][10][11][12] epitaxial films have been prepared on MgO substrates of (001), (110), and (111) orientations. Most of the films have been prepared by employing elevated substrate temperatures around 600 °C.…”

Section: Introductionmentioning

confidence: 99%

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FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

Itabashi

Ohtake

Ouchi

et al. 2014

EPJ Web of Conferences

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Abstract. FePd, FePt, and CoPt alloy epitaxial films of 40 nm thickness are prepared on MgO(111) singlecrystal substrates by employing two different methods. One is a one-step method consisting of hightemperature deposition at 600 °C and the other is a two-step method consisting of low-temperature deposition at 200 °C followed by annealing at 600 °C. Although the preparation method is different, similar final crystal structures are realized for all the film materials. FePd and FePt alloy films grow on the substrates with six L1 0 (111) variants, whose c-axes are about 35° canted from the substrate surface and rotated around the film normal by 60° each other. The order degrees of FePd and FePt films prepared by one-and two-step methods, (S one-step , S two-step ), are estimated to be (0.25, 0.33) and (0.08, 0.15), respectively. On the contrary, L1 0 ordered phase formation is not recognized for CoPt alloy films. The films prepared by one-step method have rough surfaces surrounded by side facets, whereas the films prepared by two-step method have very flat surfaces with the arithmetical mean roughness of 0.3 nm. The two-step method is useful for preparation of L1 0 ordered films with flat surface.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

Itabashi

Ohtake

Ouchi

et al. 2014

EPJ Web of Conferences

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“…In order to investigate the L1 0 crystal distribution, well-defined epitaxial films are useful, since the crystallographic orientation can be controlled by singlecrystal substrate. FePt [3][4][5] and FePd [5][6][7] epitaxial films have been prepared on (001) single-crystal substrates. However, L1 0 ordering has been mainly estimated by 2T/Z-scan out-of-plane X-ray diffraction (XRD).…”

Section: Introductionmentioning

confidence: 99%

“…However, L1 0 ordering has been mainly estimated by 2T/Z-scan out-of-plane X-ray diffraction (XRD). 2TF/I-scan in-plane XRD needs to be combined to investigate the presence of L1 0 (100) crystals [5,8,9].…”

Section: Introductionmentioning

confidence: 99%

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Fe₅₀Pt_50–xPd_xalloy thin films withL1₀structure epitaxially grown on MgO(001) substrates

Itabashi

Ohtake

Kirino

et al. 2014

EPJ Web of Conferences

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Abstract. Fe 50 Pt 50-x Pd x (at. %, x = 0, 12.5, 25, 37.5, 50) alloy epitaxial films are prepared on MgO(001) substrates at temperatures ranging from room temperature to 600 °C by radio-frequency magnetron sputtering. The effects of substrate temperature and Pd/Pt composition on the order degree, c-axis distribution, and magnetic property are investigated. With increasing the substrate temperature, L1 0 ordering is enhanced for all the compositions. The order degree of film deposited at 600 °C decreases from 0.37 to 0.23 as the x value increases from 0 to 12.5 at. %. With further increasing the x value, the order degree increases up to 0.69. The Fe 50 Pt 50-x Pd x films with x 25 consist of only an L1 0 (001) single-crystal with the c-axis perpendicular to the substrate surface, whereas the films with x < 25 involve two types of L1 0 (100) variant with the c-axis lying in the film plane in addition to L1 0 (001) variant. The c-axis distribution is influenced by the Pd/Pt composition. The magnetic anisotropy is reflecting the c-axis distribution and the order degree.

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Texture and interface characterization of iridium thin films grown on MgO substrates with different orientations

et al. 2019

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Iridium thin films are grown by direct-current plasma magnetron sputtering, on MgO single crystal substrates with various surface orientation, i.e. (100), (111) and (110). The surface morphology, the crystalline properties of the films, and the substrate-thin film interface, are investigated by atomic force microscopy (AFM), X-ray diffraction (XRD), focused ion beam scanning electron microscopy (FIB-SEM), and high-resolution transmission electron microscopy (HR-TEM), respectively. The results reveal that hetero-epitaxial thin films with different crystallographic orientation and notable atomic scale smooth surface are obtained. From the XRD analysis the following epitaxial relations are obtained: i) (100) Ir || (100) MgO out-of-plane and [001] Ir || [001] MgO in-plane for Ir grown on MgO(100), ii) (110) Ir || (110) MgO out-of-plane and [1-10] Ir || [1-10] MgO in-plane for Ir grown on MgO(110) and iii) (111) Ir || (111) MgO out-of-plane and two variants for in-plane orientation [1-10] Ir || [1-10] MgO and [1-10] Ir || [10-1] MgO , respectively for Ir grown on MgO(111). Because of the large misfit strain (9.7%), the thin films are found to grow in a strain-relaxed state with the formation of geometrical misfit dislocations with a ~2.8 nm spacing, whereas thermal strain is stored upon cooling down from the growth temperature (600 °C). The best structural characteristics are obtained for the (111) oriented films with a mosaicity of 0.3° and vanishingly small lattice distortions. The (100)-and (110)-oriented films exhibit mosaicities of ̴ 1.2° and lattice distortions of ̴ 1% which can be explained by the larger surface energy of these planes as compared to (111).

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Structure and Magnetic Properties of CoPt, CoPd, FePt, and FePd Alloy Thin Films Formed on MgO(111) Substrates

Cited by 41 publications

References 6 publications

FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

Fe₅₀Pt_50–xPd_xalloy thin films withL1₀structure epitaxially grown on MgO(001) substrates

Texture and interface characterization of iridium thin films grown on MgO substrates with different orientations

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Structure and Magnetic Properties of CoPt, CoPd, FePt, and FePd Alloy Thin Films Formed on MgO(111) Substrates

Cited by 41 publications

References 6 publications

FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

FePd, FePt, and CoPt alloy epitaxial thin films with flat surface grown on MgO(111) substrate

Fe50Pt50–xPdxalloy thin films withL10structure epitaxially grown on MgO(001) substrates

Texture and interface characterization of iridium thin films grown on MgO substrates with different orientations

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Fe₅₀Pt_50–xPd_xalloy thin films withL1₀structure epitaxially grown on MgO(001) substrates