2010
DOI: 10.1016/j.jcrysgro.2009.12.008
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Structure and dielectric tunability of (Pb0.5Ba0.5)ZrO3 thin films derived on (Sr0.95La0.05)TiO3 buffer-layered substrates

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Cited by 6 publications
(1 citation statement)
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“…So far, a few investigations had been carried out to optimize the final dielectric properties of PBZ films. State of the art works mainly focused on the influences of chemical composition, oxide buffer layer, and conductive oxides electrodes on the structure and electrical properties of PBZ films [4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…So far, a few investigations had been carried out to optimize the final dielectric properties of PBZ films. State of the art works mainly focused on the influences of chemical composition, oxide buffer layer, and conductive oxides electrodes on the structure and electrical properties of PBZ films [4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%