2020
DOI: 10.1021/acs.jpcc.0c07498
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Structure and Dielectric Properties of Anisotropic n-Alkyl Anilino Squaraine Thin Films

Abstract: Solution-processed and thermally annealed thin films from a series of n-alkyl terminated anilino squaraines are systematically investigated regarding their structural and optical properties by means of X-ray diffraction (XRD) and spectroscopic ellipsometry (SE). Their characteristic intense double-hump-shaped absorbance spectra consisting of coupled H-aggregate and intermolecular charge transfer (ICT) resonance bands make them appealing for fundamental light–matter interaction studies, and their environmental … Show more

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Cited by 16 publications
(60 citation statements)
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“…32 In contrast, for linear n-alkyl substitution triclinic crystal structures have been reported with only a single molecule per unit cell. 11,[33][34][35][36] This excludes Davydov splitting as the reason for the absorbance spectra consisting of two broad spectral features. In this case short intermolecular molecular distances based on the slipped π-stacking allows for a pronounced intermolecular charge transfer (ICT).…”
Section: Introductionmentioning
confidence: 99%
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“…32 In contrast, for linear n-alkyl substitution triclinic crystal structures have been reported with only a single molecule per unit cell. 11,[33][34][35][36] This excludes Davydov splitting as the reason for the absorbance spectra consisting of two broad spectral features. In this case short intermolecular molecular distances based on the slipped π-stacking allows for a pronounced intermolecular charge transfer (ICT).…”
Section: Introductionmentioning
confidence: 99%
“…Here, we provide the crystal structure of nOSQ, n-octyl SQ with eight carbon atoms. Together with the recently published crystal structure of nPSQ, 36 (n-pentyl SQ, five carbon atoms) the impact of the ICT on the optical spectra can be quantified for the series nBSQ, nPSQ, nHSQ, and nOSQ. Upon spincoating, these compounds were shown to form extended pseudo-uniaxial thin films with the crystallographic {0 0 1} plane parallel to the substrate but effectively random in-plane orientation.…”
Section: Introductionmentioning
confidence: 99%
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“…However, a minimal systematic deviation from the unit cell parameters is possibly present due to the thin film nature of the samples. 23 …”
mentioning
confidence: 99%
“…The transmission measurement was crucial for parameter decorrelation. 23 Reflection scans at variable AOIs and Theta Stage positions enabled the determination of the full dielectric tensor. 24 Owing to the orthorhombic symmetry, this was possible from only a single crystallographic orientation.…”
mentioning
confidence: 99%