2020
DOI: 10.1021/acs.jchemed.0c01016
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Structure Analysis from Powder Diffraction Data: Rietveld Refinement in Excel

Abstract: Powder diffraction is one of the most widely used analytical techniques for characterizing solid state materials. It can be used for phase or polymorph identification, quantitative analysis, cell parameter determination or even full crystal structure analysis using the powerful Rietveld refinement method.As with much of modern crystallography, the software used for Rietveld refinement is frequently treated as a "black box" that produces often-poorly-understood outputs. This paper shows how it is possible for s… Show more

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Cited by 26 publications
(19 citation statements)
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References 45 publications
(75 reference statements)
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“…Absorbance spectra were collected at a 2 cm À1 resolution between 4000 and 400 cm À1 , averaging 7 scans per sample. Peak deconvolution of the carbonate v 2 (850-890 cm À1 ) and v 3 (1300-1600 cm À1 ) regions and the phosphate v 4 (485-700 cm À1 ) region of the spectra was performed by fitting Gaussian distributions, using the Solver extension in Excel, 36 based on peak assignment described elsewhere; a linear background was subtracted prior to deconvolution.…”
Section: Ftir Analysismentioning
confidence: 99%
“…Absorbance spectra were collected at a 2 cm À1 resolution between 4000 and 400 cm À1 , averaging 7 scans per sample. Peak deconvolution of the carbonate v 2 (850-890 cm À1 ) and v 3 (1300-1600 cm À1 ) regions and the phosphate v 4 (485-700 cm À1 ) region of the spectra was performed by fitting Gaussian distributions, using the Solver extension in Excel, 36 based on peak assignment described elsewhere; a linear background was subtracted prior to deconvolution.…”
Section: Ftir Analysismentioning
confidence: 99%
“…The diffraction patterns obtained using the powerful Rietveld refinement method [29] were used to calculate the lattice parameter and lattice strain. Both the crystallite size and intrinsic strain were calculated using the sizestrain plot (SSP) method, which considered the XRD peak profile to be a combination of the Lorentzian function and Gaussian function, where the size-broadened XRD profile was labelled as the Lorentz function and the strain-broadened profile was labelled as the Gaussian function [30].…”
Section: Methodsmentioning
confidence: 99%
“…Absorbance spectra were collected at a 2 cm -1 resolution, averaging 7 scans per sample, between 4000 and 400 cm -1 . Peak deconvolution of the carbonate ν2 region of the spectra was performed by fitting Gaussian distributions, using the Solver extension in Excel [24], based on peak assignment described elsewhere [25].…”
Section: Sample Characterisationmentioning
confidence: 99%