Structural Study of GaSb, InSb Melts with XAFS Technique

Abstract

The XAFS spectra of GaSb, InSb melts and the corresponding solids are measured at different temperatures. The reverse Monte Carlo simulation technique is applied to the analysis of EXAFS data of molten GaSb, InSb. The partial radial distribution functions of molten GaSb, InSb are given as well as the local atomic structure models which are based on a geometrical analysis of the model atomic configurations. A discussion about the mechanism of semiconductor-metal transition from solid to liquid is presented in the light of the local structure changes