2016
DOI: 10.1016/j.jnoncrysol.2015.04.015
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Structural study by Raman spectroscopy and 77Se NMR of GeSe4 and 80GeSe2–20Ga2Se3 glasses synthesized by mechanical milling

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Cited by 7 publications
(11 citation statements)
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“…Either the work focused on a single composition of the Ge-Te-Se ternary system, or on a selenium or tellurium rich part of the system along the pseudo-binary line GeSe 4 -GeTe 4 . [15][16][17][18][19]21,26] However, different assignments of vibration bands have been reported showing the difficulties of interpretations. To interpret these results, the methodology used combine experimental acquisitions (Raman and IR) and DFT calculations on selected clusters to help in the assignment of the vibrational modes observed.…”
Section: Results On Vibrational Spectroscopy/dft Calculationsmentioning
confidence: 99%
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“…Either the work focused on a single composition of the Ge-Te-Se ternary system, or on a selenium or tellurium rich part of the system along the pseudo-binary line GeSe 4 -GeTe 4 . [15][16][17][18][19]21,26] However, different assignments of vibration bands have been reported showing the difficulties of interpretations. To interpret these results, the methodology used combine experimental acquisitions (Raman and IR) and DFT calculations on selected clusters to help in the assignment of the vibrational modes observed.…”
Section: Results On Vibrational Spectroscopy/dft Calculationsmentioning
confidence: 99%
“…The echo delay between consecutive 180° pulses was set to 700 µs to allow for the recording of the entire full echo signal. Each Free Induction Decay (FID) signal was stored in a 2D buffer and FT was performed in a 2D mode as described elsewhere [21]. The recovery delay was set to 0.5 s for full relaxation, and Double Frequency Sweep (DFS) was used to enhance the intensity of the central transition signal [22].…”
Section: Solid-state Nmr Measurementsmentioning
confidence: 99%
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“…Furthermore, the XRD pattern of the bulk GeSe4 target glass in Figure5areveals four distinct wide-stretched amorphous halo structures pinpointed at 2θ = 13, 17, 28, and 51° without any sharp peaks, which are fitted with multiple Gaussian functions. These wide-stretched bands correspond to amorphous phases of GeSe, GeSe2, and GeSe4[21,[43][44][45][46]…”
mentioning
confidence: 99%
“…The XRD patterns obtained from the silicon substrate in Figure5aexhibit a strong diffraction peak centred at 2θ = 56.07 and indexed as (311). It corresponds to Bragg's reflection of cubic silicon[40][41][42][43][44][45][46][47][48][49] with the International Centre for Diffraction Data (ICDD) reference pattern No. 00-005-0565.…”
mentioning
confidence: 99%