1994
DOI: 10.12693/aphyspola.86.605
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Structural Properties of Cd1-xMgxTe and Cd1-x-yMgxMnyTe Crystals

Abstract: Electron probe microanalysis and X-ray diffraction studies have been performed on samples of ternary Cd1-x ΜgxΤe (0.05 < x < 0.09) and quaternary Cd1-x -y Mgx Mny Τe (0.025 < x < 0.4; 0.025 < y < 0.7) alloys. The investigated samples were cut from 24 different ingots grown by Bridgman method. Microprobe examinations Iave revealed significant differences between actual and nominal content of Mg along the longitudinal direction for both ternary and quaternary ingots. In contrast to Mg, for most Cd1-x -y Μgx Μny … Show more

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Cited by 8 publications
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“…Details of sample growth and characterizations are described in Ref. 5. Pseudodielectric function spectra ͗()͘ϭ͗ 1 ()͘ ϩi͗ 2 ()͘ were measured at room temperature from 1.5 to 6.0 eV using an automatic spectroscopic rotating-analyzer ellipsometer ͑RAE͒.…”
mentioning
confidence: 99%
“…Details of sample growth and characterizations are described in Ref. 5. Pseudodielectric function spectra ͗()͘ϭ͗ 1 ()͘ ϩi͗ 2 ()͘ were measured at room temperature from 1.5 to 6.0 eV using an automatic spectroscopic rotating-analyzer ellipsometer ͑RAE͒.…”
mentioning
confidence: 99%