Structural properties, dielectric relaxation, and impedance spectroscopy of NASICON type Na3+xZr2−xPrxSi2PO12${\rm Na}_{3+x} {\rm Zr}_{2-x} {\rm Pr}_{x} {\rm Si}_2 {\rm PO}_{12}$ ceramics
Ramcharan Meena,
Rajendra S. Dhaka
Abstract:We investigate the dielectric and impedance spectroscopic investigation of Pr‐doped NASICON type () samples as a function of temperature and frequency. The Rietveld refinement of X‐ray diffraction patterns confirms the monoclinic phase having C2/c space groups for all the samples. The scanning electron microscopy shows the granular‐like structure and energy dispersive X‐ray analysis confirms the desired compositions. The temperature (90–400 K) and frequency (20 Hz–2 MHz) dependence of electric permittivity ar… Show more
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