2021
DOI: 10.1016/j.cjph.2021.06.026
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Structural, optical and electrical properties of CuSCN nano-powders doped with Li for optoelectronic applications

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Cited by 13 publications
(3 citation statements)
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“…e spectra revealed characteristic maximum absorbances at 370, 375, and 378 nm, respectively, indicating quantum size effects [38]. e bandgap energy (E g ) as calculated from Tauc's plotting for the direct allowed transition, described by Equation (3) [40][41][42], was found at 2.87, 2.80, and 1.92 eV, respectively for ZnO-NPs (Z20, Z30, and Z40) prepared using different extract volumes (20, 30, and 40 mL) (Figures 5(b)-5(d))). is denotes that the extract volume has an impact on the resulting bandgap of the synthesized ZnO-NPs, i.e., with PPE extract volume increase, the E g decreased.…”
Section: Uv-vis Analysismentioning
confidence: 99%
“…e spectra revealed characteristic maximum absorbances at 370, 375, and 378 nm, respectively, indicating quantum size effects [38]. e bandgap energy (E g ) as calculated from Tauc's plotting for the direct allowed transition, described by Equation (3) [40][41][42], was found at 2.87, 2.80, and 1.92 eV, respectively for ZnO-NPs (Z20, Z30, and Z40) prepared using different extract volumes (20, 30, and 40 mL) (Figures 5(b)-5(d))). is denotes that the extract volume has an impact on the resulting bandgap of the synthesized ZnO-NPs, i.e., with PPE extract volume increase, the E g decreased.…”
Section: Uv-vis Analysismentioning
confidence: 99%
“…The diffraction peaks of the sample at ambient conditions agree well with those of the β phase. 31,32 No obvious change is observed in the pattern with increasing pressure up to 4 GPa, except for the shift of diffraction peaks to higher angles. At above 4 GPa, several new peaks appeared (as indicated by the asterisk), and the intensity of these peaks gradually grew with pressure, while the diffraction peaks from the β phase weakened, suggesting a structural phase change in β-CuSCN at this pressure, which is consistent with the Raman and IR measurements.…”
Section: ■ Results and Discussionmentioning
confidence: 93%
“…Te XRD peaks for Ag-ZnS demonstrate the formation of clear distinct phases for Ag, ZnS, and Zn. Te crystallite size D (nm) and the average dislocation density (δ) for all the synthesized materials were estimated using the Scherer formula D � (0.9λ/β cos θ) [30,31] and δ � 1/D 2 [32], respectively. Te microstrain (ε) was computed using the equation ε � β cos θ/4, where β is the full width at half maximum, λ � 0.154 nm, and θ is Bragg's difraction angle, and Stacking fault (SF) was calculated by the equation SF � [2π 2 /45(3 tan θ) .5 ]β [33,34].…”
Section: Xrd Analysismentioning
confidence: 99%