Structural, Optical and Electrical Properties of CdZnSe Films

Abstract

Thin films of Cd 1-x Zn x Se (x = 0, 0.2, 0.4, 0.6, 0.8 & 1) with variable composition have been deposited onto glass substrates using mechanically mixed CdSe and ZnSe by vacuum evaporation technique. These thin films have been characterized through the XRD, optical and electrical characterization technique. XRD patterns confirm the preferred orientation and polycrystalline nature of the thin films. Absorption edge shifts towards lower wavelength range with the increase of Zn concentration. The variations of energy band gap have been determined and discussed with Zn concentration. The electrical conductivity of so prepared thin films has been determined in the temperature range from room to 413 K. The result indicates that the electrical conductivity decreases with increasing Zn content