Structural, optical and electrical characterization of SnS nanomaterials grown at different temperatures

Synergistic Effect of Redox Dual PdOx/MnOx Cocatalysts on the Enhanced H2 Production Potential of a SnS/α-Fe2O3 Heterojunction via Ethanol Photoreforming

“…Pristine α-Fe 2 O 3 , which was synthesized from the decomposition of Fe­(acac) 3 in DMF in the presence of PVP surfactant at 180 °C, presents distinct diffraction peaks at 2θ = 24.1°, 33.1° (main characteristic peak), 35.6°, 40.8°, and 49.4°, assigned to the crystal planes of (012), (104), (110), (113), and (024), respectively (Figure (a)) . For pristine SnS, formed from SnCl 2 and sulfur in the presence of PVP in DMF, the characteristic diffraction peaks were observed at 2θ = 21.9°, 25.9°, 27.6°, 31.9°, 39.2°, 42.6°, 45.5°, and 48.5° corresponding to the (011), (012), (102), (004), (113), (021), (015), and (023) diffraction planes, respectively (Figure (a)) …”

“… 29 For pristine SnS, formed from SnCl 2 and sulfur in the presence of PVP in DMF, the characteristic diffraction peaks were observed at 2θ = 21.9°, 25.9°, 27.6°, 31.9°, 39.2°, 42.6°, 45.5°, and 48.5° corresponding to the (011), (012), (102), (004), (113), (021), (015), and (023) diffraction planes, respectively ( Figure 1 (a)). 30 …”

“…29 For pristine SnS, formed from SnCl 2 and sulfur in the presence of PVP in DMF, the characteristic diffraction peaks were observed at 2θ = 21.9°, 25.9°, 27.6°, 31.9°, 39.2°, 42.6°, 45.5°, and 48.5°corresponding to the (011), (012), (102), (004), (113), (021), (015), and (023) diffraction planes, respectively (Figure 1(a)). 30 In the PXRD pattern of FeOSnS1−3 heterocatalysts (Figure 1(a)), a series of characteristic diffractions peaks from α-Fe 2 O 3 (indicated by the symbol #) and SnS (indicated by the symbol *) are observed. In addition, the main diffraction peaks in the heterocatalysts have minor changes compared with pristine α-Fe 2 O 3 and SnS, suggesting that the hybridization had a negligible influence on the original crystal structure of the constituents.…”

Azimuthal angle dependent dielectric function of SnS by ellipsometry

“…Complex dielectric function ε = ε 1 + iε 2 or refractive index Ñ = n + ik values provide useful insight into the electronic structure for better characterization of device performance [15]. There are many reports on the optical properties of SnS by absorption and reflection [16], photoluminescence [17], photoreflectance [18], ultraviolet-visible-near infrared spectroscopy [19], and spectroscopic ellipsometry (SE) [2,3,14]. In this work, we used the SE because it directly determines the dielectric function and refractive index of a material [20,21] without using the Kramers-Kronig relations.…”

Temperature dependence of the dielectric function and critical points of α-SnS from 27 to 350 K

“…The complex dielectric function ε = ε 1 + iε 2 and refractive index Ñ = n + ik are especially useful for gaining insight into the electronic bandgap structure needed to characterize device performance 15 – 18 . As a consequence, optical properties have been measured by reflection and absorption 19 , photoreflectance 20 , optical-absorption measurements 21 on single crystals, UV–Vis-near infrared spectroscopy 22 , photoluminescence 23 , 24 , and UV–Vis spectrometry 25 of poly- and nano-crystalline films. Among optical metrology techniques, spectroscopic ellipsometry (SE) is the most powerful for determining dielectric functions and refractive indices of materials 26 – 30 .…”