Structural non-uniformities in mercuric iodide crystals grown by two different vapour growth techniques

Structural defects in Hg1−xCdxI2 layers grown on CdTe substrates by vapor phase epitaxy

“…The SXRT characterization has been shown earlier to be the most appropriate method for the structural studies of HgI 2 bulk crystals. 16 This is because of a high x-ray absorption of this material as well as other Hg-based compound semiconductors, which limits the use of the conventional xray topography with Cu K ␣ radiation source ͑as recent examples, see Refs. 17 Figure 1 shows ͑a͒ the typical cleaved cross section of Hg 1Ϫx Cd x I 2 /CdTe VPE heterostructure and the surface morphology of the Hg 1Ϫx Cd x I 2 layers grown ͑b͒ for 50 h and ͑c͒ for 80 h. The cross section independent of the growth time exhibits three regions of different contrast which are the Hg 1Ϫx Cd x I 2 layer ͑I͒, the interface platelet layer ͑II͒, and the CdTe substrate ͑III͒.…”

“…2,16 The density of these defects in HgI 2 bulk crystals increases with growth time and crystal size. 16 Nevertheless, our findings show the opposite for Hg 1Ϫx Cd x I 2 VPE layers.…”

“…2,16 The density of these defects in HgI 2 bulk crystals increases with growth time and crystal size. 16 Nevertheless, our findings show the opposite for Hg 1Ϫx Cd x I 2 VPE layers. They may suggest that the subgrain boundaries and striations in the layers are due to mechanical strains which have arisen from the layer-substrate lattice mismatch at the interface.…”

Applications of Synchrotron-Based X-ray Microprobes

“…Since the pioneering studies demonstrating the feasibility of soft X-ray microscopy and spectromicroscopy for imaging and providing chemical state information on various bulk materials and associated surfaces, ,− ,,, there has been an explosion in applications in the material ,,,,,,,,− and in the polymer ,,,,,− sciences. Many applications in material and polymer sciences do not require that samples be examined in a hydrated state; thus, UHV conditions are often conducive, allowing surface-sensitive XPS and electron yield detection for imaging (XSEM) and XAFS spectroscopy.…”

“…The high symmetry of the bonding environments for both Co and Ni was attributed to occupancy of interstitial or substitutional tetrahedral sites in the diamond lattice. 258 Since the pioneering studies demonstrating the feasibility of soft X-ray microscopy and spectromicroscopy for imaging and providing chemical state information on various bulk materials and associated surfaces, 29,[45][46][47]49,50,65 there has been an explosion in applications in the material 41,49,70,85,116,117,121,218,[259][260][261][262][263][264][265][266][267][268][269][270][271] and in the polymer 51,56,76,82,229, sciences. Many applications in material and polymer sciences do not require that samples be examined in a hydrated state; thus, UHV conditions are often conducive, allowing surface-sensitive XPS and electron yield detection for imaging (XSEM) and XAFS spectroscopy.…”