2013
DOI: 10.1016/j.matlet.2012.09.117
|View full text |Cite
|
Sign up to set email alerts
|

Structural, morphological and optical properties of highly monodispersed PEG capped V2O5 nanoparticles synthesized through a non-aqueous route

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

3
7
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
10

Relationship

0
10

Authors

Journals

citations
Cited by 31 publications
(10 citation statements)
references
References 16 publications
3
7
0
Order By: Relevance
“…The cells were charged and discharged on a multi-channel battery test system (NEWARE BTS-TC35) over the voltage range of 0 -1.6 V versus Mg/Mg +2 at constant constant current density ~40 μAcm −1 . are highly crystallized in structure and the entire diffraction peaks match well with Bragg reflections of the pure orthorhombic phase of V 2 O 5 nanoparticles, which is consistent with the standard JCPDS No.41-1426 (space group Pmmn) [17] [18]. However, for x > 0% an additional diffraction shoulder peak around 26.77˚, partially overlapping with the V 2 O 5 (110) peak (2θ = 26.39˚), originates from the (002) diffraction of the graphite.…”
Section: Methodssupporting
confidence: 82%
“…The cells were charged and discharged on a multi-channel battery test system (NEWARE BTS-TC35) over the voltage range of 0 -1.6 V versus Mg/Mg +2 at constant constant current density ~40 μAcm −1 . are highly crystallized in structure and the entire diffraction peaks match well with Bragg reflections of the pure orthorhombic phase of V 2 O 5 nanoparticles, which is consistent with the standard JCPDS No.41-1426 (space group Pmmn) [17] [18]. However, for x > 0% an additional diffraction shoulder peak around 26.77˚, partially overlapping with the V 2 O 5 (110) peak (2θ = 26.39˚), originates from the (002) diffraction of the graphite.…”
Section: Methodssupporting
confidence: 82%
“…In this case, a clear difference in reflectance can be observed due to the presence of interference fringes, indicating a highly homogeneous film (Tiagarajan and Ganesan, 2015). Such a pattern has been reported in the literature for metal oxide films grown on silicon substrates (Venkatesan et al, 2013;Abazari et al, 2014). The N-implantation reduces the reflectance, which may be attributed to the creation of more scattering centres and grain boundaries due to N ions (Guo et al, 2021).…”
Section: Uv-vis Studysupporting
confidence: 66%
“…Peaks observed in the region of 400-700 cm −1 are assigned to symmetric stretching of V-O-V. It gradually shifts to the lower wave numbers and merges with bending V-O-V peak with increasing the annealing temperature to 600 ∘ C. FT-IR peaks position and bond attributions in samples and their comparison to the earlier literature are listed in Table 1 [23][24][25]. Figure 6 shows SEM images of the coatings deposited on quartz glass and silicon, obtained after thermal treatment at 200 ∘ C for 10 h (Figures 6(a) and 6(b), resp.).…”
Section: Resultsmentioning
confidence: 88%