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2015
DOI: 10.17571/appslett.2015.01012
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Structural Modification of Polysulfone doped Cu2O Nanospheres

Abstract: Semiconductor reinforced polymer nanocomposite materials are of great interest nowdays. The present communication describes the reinforcement of cuprous oxide (Cu2O) within polysulfone matrices. The conversion of amorphous to crystalline phase will be determined using X-ray diffraction and FT-IR studies. The morphological investigations have been carried out employing atomic force microscopy. The optical transition has been studied using UV-Visible spectroscopy. The successful grafting of semiconductor nanosph… Show more

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Cited by 3 publications
(2 citation statements)
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“…This represents the accumulation of space charge carriers at the interface of the ionically conducting SPE films and SS blocking electrode. The disappearance of the semicircular region in the impedance spectra after the addition of nanofiller leads to the conclusion that the total conductivity is due to the conduction of fast ion charge migration, so only a diffusion process takes place [72][73][74][75]. This also indicates that conduction is now supported by dispersed nanofiller with the surface group.…”
Section: Complex Impedance Spectroscopy (Cis) Analysismentioning
confidence: 99%
“…This represents the accumulation of space charge carriers at the interface of the ionically conducting SPE films and SS blocking electrode. The disappearance of the semicircular region in the impedance spectra after the addition of nanofiller leads to the conclusion that the total conductivity is due to the conduction of fast ion charge migration, so only a diffusion process takes place [72][73][74][75]. This also indicates that conduction is now supported by dispersed nanofiller with the surface group.…”
Section: Complex Impedance Spectroscopy (Cis) Analysismentioning
confidence: 99%
“…free ions and ion pairs. So, to study above degeneracy and presence of both ions, deconvolution of the PF − 6 peak is undertaken, as explained somewhere [40,41].…”
Section: Fourier Transform Infra-red Spectroscopy (Ftir) Analysismentioning
confidence: 99%